An infrared image attendance method based on large field of view binocular vision
An infrared image and binocular vision technology, which is applied in the field of face recognition, can solve the problems such as the decline of the recognition effect and the inability to meet the actual system, and achieve the effect of improving the speed and efficiency of recognition, improving the accuracy of recognition, and strong practicability.
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[0037] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0038] Such as figure 1 As shown, the infrared image face recognition attendance method of a kind of large-field binocular vision of the present invention comprises the following steps:
[0039] Step 1: Classroom image collection: use the binocular infrared camera to collect synchronous data in the classroom, and obtain two images from different angles in the same scene, requiring overlapping areas between the images to be stitched, such as image 3 shown;
[0040] Step 2: Binocular image stitching: stitching the left eye image and the right eye image;
[0041] The schematic diagram of the device structure used in step 2...
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