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X-ray phase contrast imaging system and imaging method

A phase contrast imaging and imaging system technology, applied in imaging devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of increasing scanning time, time-consuming mechanical system stepping, and obstacles to the promotion of grating imaging technology, etc. Achieve the effect of reducing scanning time, good practicality, and reducing the need for high-precision translation

Active Publication Date: 2019-03-19
TSINGHUA UNIV +1
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Problems solved by technology

[0005] But even so, the existence of stepping technology still poses a great obstacle to the promotion of grating imaging technology. The stepping of the mechanical system is very time-consuming, which greatly increases the scanning time. At the same time, even the translation of tens of microns still affects the accuracy of mechanical equipment. , overall equipment shockproof, ambient temperature, etc. have high requirements, these two aspects greatly limit the application and promotion of this new grating imaging technology

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  • X-ray phase contrast imaging system and imaging method

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Embodiment )

[0074] Several application examples of the present invention will be described below.

[0075] Figure 4 It is a schematic diagram of Embodiment 1 of the present invention. Such as Figure 4 As shown, embodiment 1 shows that the X-ray phase contrast imaging system based on the distributed X-ray source of the present invention is used for X-ray photography, and three kinds of images of attenuation, phase contrast and dark field can be obtained simultaneously after one scan, and can be used It is used in the new generation of mammary gland machine and other applications.

[0076] also, Figure 5 It is a schematic diagram of Embodiment 2 of the present invention. Such as Figure 5 As shown, Embodiment 2 shows that the X-ray phase contrast imaging system based on the distributed X-ray source of the present invention is used for X-ray CT imaging, and the scanning sample W can be rotated along the direction perpendicular to the optical path, so that the three-dimensional struct...

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Abstract

The present disclosure relates to an X-ray imaging system and imaging method. The X-ray imaging system according to the present disclosure comprises a distributed X-ray source arrangement, a fixed grating module, an X-ray detecting device and a computer workstation. An object to be detected is disposed between the distributed X-ray source arrangement and the fixed grating module. The computer workstation performs control such that: the X-ray sources of the distributed incoherent X-ray source arrangement sequentially generate X-rays to emit X-rays to an object to be detected; for each exposure, the X-ray detecting device receives the X-rays, wherein after a series of stepping exposures of the distributed incoherent X-ray source arrangement and corresponding data acquisitions, at each pixel of the X-ray detecting device, X-ray intensities are represented as an intensity curve; the intensity curve is compared to an intensity curve in the absence of the object to be detected, and a pixel value at each pixel is obtained from a variation of the intensity curves; and image information of the object to be detected is obtained according to the obtained pixel values.

Description

technical field [0001] The invention relates to an X-ray grating imaging technology, in particular to an X-ray phase contrast imaging system and an imaging method based on a distributed X-ray source. Background technique [0002] In existing technologies such as CT scanning equipment, X-rays are widely used to scan and image objects. Traditional X-ray scanning imaging generally uses the X-ray attenuation characteristics of the measured material to inspect the internal structure of the object in a non-destructive manner. The effect of traditional X-ray imaging technology is particularly significant if the density of the structural composition of each part inside the object is significantly different. However, for substances composed of light elements, they are weak absorbers for X-rays, so their internal specific structures can hardly be seen with traditional X-ray imaging techniques. Even if other auxiliary means are used, for example, it is difficult to obtain a clear ima...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/046G01N23/083
CPCG01N23/041G21K2207/005G01N23/046G01N2223/3306G01N2223/401G01N2223/408
Inventor 张丽陈志强姜晓磊朱晓骅金鑫
Owner TSINGHUA UNIV
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