Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electronic product production line and voltage withstand test system thereof

A technology for withstand voltage testing and electronic products, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of low production efficiency, achieve the effect of improving production efficiency and reducing the steps of withstand voltage testers and electronic products

Inactive Publication Date: 2016-04-20
ZHUHAI GOTECH INTELLIGENT TECH
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the problem that the existing electronic product withstand voltage test is manually operated to connect the withstand voltage tester and the electronic product, and the production efficiency is very low, the present invention provides a new withstand voltage test system; Hipot test system for electronic product production line

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electronic product production line and voltage withstand test system thereof
  • Electronic product production line and voltage withstand test system thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0026] Such as figure 1 with figure 2 , figure 1 It is a schematic diagram of the overall structure of the withstand voltage test system in the specific implementation of the present invention, figure 2 It is a schematic diagram of the actuator in the withstand voltage test system in the specific implementation of the present invention.

[0027] The withstand voltage testing system provided by the present invention, in addition to including the withstand ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an electronic product production line and a voltage withstand test system thereof. The voltage withstand test system comprises a voltage withstand tester and further comprises a positioning and clamping device and a controller. The positioning and clamping device comprises a first driving component and a clamping plate fixedly connected with the first driving component. The controller is connected with the first driving component and used for controlling the first driving component to move the clamping plate. Two test probes of the voltage withstand tester are fixedly installed on the two clamping sides of the clamping plate. After the clamping plate clamps an electronic product, one test probe makes contact with an alternating current input line of the electronic product, and the other test probe makes contact with a metal shell of the electronic product. Thus, the step of manually connecting the voltage withstand tester and the electronic product in production is omitted, and production efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of withstand voltage testing of electronic products, in particular to a withstand voltage testing system. Background technique [0002] The withstand voltage test is a test procedure that electronic products must pass before leaving the factory. It applies a high voltage much higher than the normal operating voltage of electronic products to electronic products to test the withstand voltage capabilities of their electrical devices, insulating materials and insulating structures. , found problems such as local insulation defects, moisture and aging defects. [0003] In the existing production process of electronic products, a withstand voltage tester is used for the withstand voltage test. The production process is as follows: first, the product is manually fixed, and then the two test probes of the withstand voltage tester are manually contacted with the AC input line of the product. And the product shell, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/18
CPCG01R31/18
Inventor 唐承立李勇志张华
Owner ZHUHAI GOTECH INTELLIGENT TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products