Three-dimensional measurement method based on sinusoidal and triangular wave fringe projection

A technology of three-dimensional measurement and fringe projection, which is applied in the field of three-dimensional measurement, can solve the problems of affecting measurement speed and time-consuming, and achieve the effect of improving measurement accuracy, reducing the number of frames, and increasing the speed of three-dimensional measurement

Active Publication Date: 2018-03-23
NANCHANG HANGKONG UNIVERSITY
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Problems solved by technology

In traditional measurement methods, usually more than 6 fringe images are required to achieve absolute phase measurement, which takes a long time and directly affects the measurement speed

Method used

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  • Three-dimensional measurement method based on sinusoidal and triangular wave fringe projection
  • Three-dimensional measurement method based on sinusoidal and triangular wave fringe projection
  • Three-dimensional measurement method based on sinusoidal and triangular wave fringe projection

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Embodiment Construction

[0019] The embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings, but the present embodiments are not intended to limit the present invention, and any similar structures and similar changes of the present invention should be included in the protection scope of the present invention.

[0020] The present invention works and implements like this, based on the three-dimensional measurement method of sinusoidal and triangular wave fringe projection, it is characterized in that three key parts are composed of triangular wave fringe encoding principle, sine and triangular wave four fringe phase solution and dewrapping principle, and three-dimensional measurement principle composition.

[0021] (1) The principle of triangular wave stripe coding

[0022] Two sets of triangular waves with a phase shift of half a period are generated in the same period, and the allocation of pixels in each set of triangular waves is ...

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Abstract

The invention discloses a three-dimensional measuring method based on sine and triangular wave fringe projection, which is composed of three key parts: the triangular wave fringe encoding principle, the sine and triangular wave four fringe phase solving and unwrapping principle, and the three-dimensional measuring principle. The advantages of the present invention are: (1) Compared with the traditional sinusoidal fringe projection method: in the traditional measurement method, usually more than or equal to 6 fringe images are needed to realize the measurement of the absolute phase, this method only needs to project 2 sinusoidal fringes respectively and 2 triangular wave fringes, which improves the measurement speed; (2) Two linear triangular wave fringes are used, and the wrapped phase is obtained by calculating the triangular wave intensity modulation and intensity contrast, which can reduce the influence of the reflectivity of the object surface, thereby further improving the measurement precision. (3) Due to the small number of projection fringes and fast measurement speed, this method has potential application prospects and practical value in the fast and real-time 3D measurement of dynamic objects.

Description

technical field [0001] The invention relates to a three-dimensional measurement method, in particular to a three-dimensional measurement method based on sinusoidal and triangular wave fringe projection. Background technique [0002] Structured light projection profilometry is of great significance in three-dimensional measurement due to the advantages of non-contact, full-field lossless measurement, fast measurement speed, high sensitivity and high degree of automation. 3D measurement systems such as figure 1 As shown, it includes DLP projector 1, CCD2, workstation 3, measurement bracket 4, reference plane 5 and object 6 to be measured; DLP projector 1 and CCD2 are placed on measurement bracket 4; DLP projector 1 and CCD2 pass data lines respectively The workstation 3 is connected; the object to be measured 6 is placed on the reference plane 5; the workstation 3 includes an image acquisition card, projection software, and measurement software. The DLP projector 1 focuses a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
Inventor 伏燕军曾灼环黄超屈国丽江光裕
Owner NANCHANG HANGKONG UNIVERSITY
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