Fast 3D measurement method based on sinusoidal and binary fringe projection

Abstract

The invention discloses a quick three-dimensional measurement method based on sinusoidal and binary fringe projection. The quick three-dimensional measurement method based on sinusoidal and binary fringe projection includes the steps: generating three sinusoidal phase shifting fringe diagrams and a binary fringe diagram through a computer; sequentially projecting the four fringe diagrams to the surface of a measured object through the projector, and acquiring each projected diagram through a camera; solving the parcel phase by means of the three sinusoidal phase shifting fringe diagrams; performing image filtering preprocessing by means of the binary fringe diagram, performing binary processing on the preprocessed image, performing marking on the communicated region, performing comparisonassignment operation, and finally performing phase shifting coding double operation to obtain the fringe level of all the pixel points; performing phase unwrapping to obtain the absolute phase for three-dimensional reconstruction; and performing three-dimensional reconstruction and phase-height conversion. The quick three-dimensional measurement method based on sinusoidal and binary fringe projection can perform phase solution and parcel unwrapping only by using the four structured light fringe diagrams, and can perform more measurements at the same time and the same measurement precision, thus improving the three-dimensional measurement speed.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, in particular to a fast three-dimensional measurement method based on sinusoidal and binary fringe projection. Background technique [0002] The optical three-dimensional measurement technology based on fringe projection has the advantages of non-contact, high efficiency, high precision and high degree of automation, and is currently the most promising three-dimensional measurement method. 3D measurement systems such as figure 1 As shown, it includes DLP projector 1, CCD2, workstation 3, measurement bracket 4, reference plane 5 and object 6 to be measured; DLP projector 1 and CCD2 are placed on measurement bracket 4; DLP projector 1 and CCD2 pass data lines respectively The workstation 3 is connected; the object to be measured 6 is placed on the reference plane 5; the workstation 3 includes an image acquisition card, projection software, and measurement software. The DLP projector 1...

AI Technical Summary

Problems solved by technology

In traditional measurement methods, usually more than six fringe images are required to achieve absolute phase measurement, which takes a long time and directly affects the measurement speed

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