Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Method for Database Overlap Pattern Summary Generation Based on Multi-label Propagation

An overlapping mode and multi-label technology, applied in the database field, can solve problems such as user misunderstanding, incomplete summary results, and inability to fully meet user needs

Inactive Publication Date: 2018-09-28
NANKAI UNIV
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Considering only non-overlapping cases can lead to incomplete summary results and even mislead users
[0004] Compared with the non-overlapping mode summary, it is often not able to fully meet the needs of users

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Method for Database Overlap Pattern Summary Generation Based on Multi-label Propagation
  • A Method for Database Overlap Pattern Summary Generation Based on Multi-label Propagation
  • A Method for Database Overlap Pattern Summary Generation Based on Multi-label Propagation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0072] The processing flow of the method of the present invention is as follows figure 1 Shown.

[0073] The following describes the specific implementation of the method of the present invention in conjunction with the examples, such as figure 2 Shown is a schematic diagram of the relational database of the embodiment. The pattern summary generated by the overlapping pattern summary generation method is as follows Image 6 Shown, where Image 6 (c) It is a summary diagram of overlapping modes, which is convenient for users to clarify the relationship of complex modes. At the same time, users can also view a certain part of the mode summary diagram in detail. Image 6 (a) and (b). The following combination figure 2 The illustrated embodiment describes the specific steps of the method of the present invention:

[0074] Step 1: Map the database schema to a multi-label graph with weights.

[0075] 1.1. Map the database schema to a multi-label graph,

[0076] First traverse the pat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a database overlap mode abstract generating method based on multi-label propagation. The overlap mode abstract generating method comprises: mapping database mode information into a multi-label graph model; clustering the database mode information with a multi-label propagation algorithm, and generating an overlap group; clustering the overlap group with a hierarchical clustering algorithm, and further generating result categories of appropriate sizes; and and finally, on the basis of an information entropy and a random walk model, selecting a topic table for each result category, thus generating the final overlap mode abstract of the database. According to the overlap mode abstract generating scheme provided by the invention, a user can be provided with a more accurate and more meaningful database overlap mode abstract, thus helping the user to understand the database information quickly.

Description

Technical field [0001] The invention belongs to the field of database technology, and specifically relates to a new type of relational database overlapping pattern abstract generation technology. Background technique [0002] With the popularization of computers and the rapid development of information technology, a large amount of data information has made database technology widely used, and database applications have begun to move toward ordinary users. However, the scale of modern databases is often very large and complex. If users want to generate an appropriate structured query language during the query process, they must have a certain understanding of the database schema information. However, the schema information corresponding to large-scale databases is usually very complicated, and related documents are commonly missing, which makes it difficult for users to understand the database schema. [0003] The pattern summary generation technology can effectively solve the abo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/30
CPCG06F16/26G06F16/285
Inventor 袁晓洁于漫王超靳宇东温延龙
Owner NANKAI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com