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Test analysis report generation method and test analysis report generation device

A technology for test analysis and report generation, applied in the computer field, it can solve the problems of high writing threshold, low accuracy, and large workload, so as to enhance pertinence and effectiveness, reduce blindness, improve frequency and ease of operation Effect

Inactive Publication Date: 2015-11-25
PEKING UNIV FOUNDER GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] In this embodiment, according to the unified requirements and format of the test process data, the method of extracting, summarizing and analyzing and automatically generating test analysis report documents is used to solve the problems of high writing threshold, heavy workload and poor timeliness existing in the existing methods. , low accuracy and many other problems

Method used

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  • Test analysis report generation method and test analysis report generation device
  • Test analysis report generation method and test analysis report generation device

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Embodiment Construction

[0032] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0033] In the following description, many specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here, therefore, the present invention is not limited to the specific embodiments disclosed below limit.

[0034] figure 1 A schematic flowchart of a method for generating a test analysis report according to an embodiment of the present invention is shown.

[0035] like figure 1 As shown, the method for generating a test analysis report acco...

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Abstract

The invention provides a test analysis report generation method and a test analysis report generation device, wherein the test analysis report generation method comprises the following steps: obtaining test data; carrying out statistics on the test data according to various statistics items of a test analysis report; and correspondingly filling the test analysis report with statistics results of various statistics items to generate a test analysis report file. By utilizing the technical scheme of the test analysis report generation method and the test analysis report generation device, test procedure data are subjected to extraction, conclusion and analysis according to unified requirements and format, and the test analysis report file is automatically generated to solve the problems of high writing threshold, large workload, low efficiency, low accuracy and the like existing in a generation process of a conventional test analysis report.

Description

technical field [0001] The present invention relates to the field of computer technology, in particular to a method for generating a test analysis report and a device for generating a test analysis report. Background technique [0002] In the current test statistical analysis process, it is usually necessary to manually collect and summarize a large amount of data, and then perform statistical analysis one by one, and finally obtain the test analysis data that meets the specification requirements, and manually fill in the test analysis report document. [0003] In the current testing process, there are clear test case data, defect tracking management system to record vulnerability (bug) data, and test analysis reports have fixed requirements and formats. However, there is a lack of methods to automatically perform statistical analysis on these scattered test process data according to the requirements and format of the test analysis report and automatically generate the proce...

Claims

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Application Information

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IPC IPC(8): G06F17/24G06Q10/10
Inventor 张立业
Owner PEKING UNIV FOUNDER GRP CO LTD
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