A test probe and test device

Abstract

Embodiments of the present invention provide a test probe and a test device, which relate to the field of display technology and are used to ensure good contact between the test probe and the surface of the test sample, while reducing the damage of the test probe to the surface of the test sample and the damage of the test probe. wear and tear. The test probe includes: a housing, a piston, an elastic device and a sphere; the housing includes a test end and a fixed end, and the test end is provided with a test opening; the piston can slide between the test end and the fixed end along the inner wall of the housing, and the piston and the fixed end The fixed end of the housing forms a conductive colloid cavity, and the conductive colloid can overflow from the gap between the piston and the inner wall of the housing by squeezing the piston; the first end of the elastic device is fixed on the piston, and the second end of the elastic device extends toward the test end The sphere is arranged at the test opening, the sphere can rotate in the test opening and the size of the test opening is smaller than the diameter of the sphere; the sphere and the second end of the elastic device are separated by a preset distance. Embodiments of the present invention are used for the detection of test samples.

Description

technical field [0001] The invention relates to the technical field of displays, in particular to a test probe and a test device. Background technique [0002] With the development of display technology, liquid crystal display (English full name: Thin Film Transistor-Liquid Crystal Display, abbreviation: TFT-LCD) has been widely used in the display field. For liquid crystal displays, the quality of the array substrate has a crucial impact on the final display effect, so in the process of manufacturing liquid crystal display panels, the detection of the array substrate is a very important link. [0003] In the inspection process of array substrates, test probes are widely used. The test probe widely used in the prior art is a conductive probe with a simple metal needle-like structure. When testing the array substrate, the test probe is first brought into contact with the surface of the test sample, and then the test signal is applied to the test probe. , and transmit the te...

AI Technical Summary

Problems solved by technology

However, the test probe in the prior art needs to be in direct contact with the test sample, so when the test probe in the prior art is used to test the test sample, it is easy to cause scratch damage on the surface of the sample and wear of the test probe. In order to avoid scratches and damage on the surface of the sample and the wear of the test probe, the contact between the test probe and the test sample is light, which will easily lead to poor contact between the probe and the test sample, which will lead to large errors in the test results, or even wrong test results.

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