Storage-state vacuum electronic device residual life detection method

Abstract

The invention discloses a storage-state vacuum electronic device residual life detection method which comprises the following steps: 10) collecting historical information of devices of the same kinds; 20) collecting status information of a vacuum electronic device to be detected; 30) obtaining a performance data set of the vacuum electronic device to be detected; 40) obtaining Euclidean distance; and 50) calculating the residual life of the vacuum electronic device to be detected. The detection method can detect the residual life of the vacuum electronic device in the storage state.

Description

technical field [0001] The invention relates to the field of remaining life detection of vacuum electronic devices, in particular to a method for detecting the remaining life of vacuum electronic devices in storage state. Background technique [0002] A vacuum electronic device refers to a device that converts one form of electromagnetic energy into another form of electromagnetic energy by means of electrons interacting with an electromagnetic field in a vacuum or gas. It has a vacuum-tight shell and a number of electrodes, the inside of the tube is evacuated, and the residual gas pressure is 10 -4 ~10 -8 Pa. Some are filled with gas of required composition and pressure after pumping out the gas in the tube. Widely used in broadcasting, communication, television, radar, navigation, automatic control, electronic countermeasures, computer terminal display, medical diagnosis and treatment and other fields. [0003] A considerable number of vacuum electronic devices, su...

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Problems solved by technology

[0004] There are two types of remaining life prediction models. The first one is based on physical models and uses cathode life to evaluate the remaining life of vacuum electronic devices. However, the cathode is only one of the factors that affect the life of vacuum electronic devices. The principle of vacuum electronic devices is very complicated and cannot be established. A physical model reflecting all factors that affect the remaining lifetime of vacuum electronic devices

The second is based on a statistical model. First, it is assumed that the life of vacuum electronic devices conforms to a certain probability distribution, and the remaining life of vacuum electronic devices is used to fit the probability distribution. However, the life distribution of vacuum electronic devices is quite complicated and does not show obvious differences. Regularity, so the above methods are not suitable

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