Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Interconnection evaluation system and method for switchboard

A technology for evaluating systems and switchboards, applied in electrical connection testing, measuring electricity, telephone communication, etc., can solve problems such as unfavorable configuration, low possibility of finding problems, and time-consuming, so as to minimize personal injury and property damage, The effect of high likelihood minimization

Inactive Publication Date: 2015-09-30
LSIS CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

According to the prior art, the method of testing the interconnection of the switchboard is disadvantageously configured in such a way that the input part of the switchboard and the output part corresponding to the input part are formed, and when a predetermined input value is input to the input part, corresponding to The output value of the input value is checked one by one
Therefore, when the switchboard is completed, use a tester to test the completeness (integrity) of the switchboard in terms of contact test, and when there are many contacts, it takes a lot of time, and there is a possibility of finding a problem at the time of contact test Low sex

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Interconnection evaluation system and method for switchboard
  • Interconnection evaluation system and method for switchboard
  • Interconnection evaluation system and method for switchboard

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] Hereinafter, exemplary embodiments of the present disclosure will be described in detail with reference to the accompanying drawings.

[0035] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present disclosure. Thus, in some embodiments, well-known processes, well-known device structures, and well-known technologies have not been described in detail in order to avoid obscuring the present disclosure. Throughout the specification, the same reference numerals will be used to refer to the same or similar parts.

[0036] It will be understood that although the terms first, second, A, B, (a), (b), etc. may be used herein to describe various elements, these elements should not be replaced by these terms in terms of content, sequence, or order. limit. These terms are only used to distinguish one element from another. It will be understood that when an element is referred to as being "connecte...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An interconnection evaluation system according to the present disclosure includes a switchboard including at least one endpoint, at least one endpoint contact tester configured to transmit a digital input signal obtained from each endpoint, an automation tester configured to output a preset digital output signal to the switchboard, and to generate interconnection information at each endpoint by reflecting the digital output signal and digital input signal, and an interface unit configured to generate a switchboard status information of switchboard by reflecting the interconnection information.

Description

technical field [0001] The present disclosure relates to an interconnect evaluation system and method for a switchboard configured to automatically test the interconnects of the switchboard. Background technique [0002] The information disclosed in this relevant section is only for enhancement of understanding of the general background of the disclosure and should not be taken as an acknowledgment or any kind of suggestion that this information forms the prior art known to a person skilled in the art. [0003] The switchboard includes many wires and many contact distribution bridges, so that the switchboard is subject to a high probability of defects due to human error due to manual configuration. According to the prior art, the method of testing the interconnection of the switchboard is disadvantageously configured in such a way that the input part of the switchboard and the output part corresponding to the input part are formed, and when a predetermined input value is inp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/024G01R31/3277G01R31/2844G01R31/66H04M3/28H04M5/06
Inventor 李佑昔赵镛纪
Owner LSIS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com