Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Binocular vision three-dimensional morphology measurement method based on time and space constraints

A technology for binocular vision measurement and three-dimensional topography, which is used in measurement devices, instruments, optical devices, etc., can solve the problems of incomplete edge information extraction and inaccurate measurement efficiency.

Active Publication Date: 2015-09-23
DALIAN UNIV OF TECH
View PDF5 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved in the present invention is to invent a binocular vision three-dimensional shape measurement method based on time-space constraints to solve the problems of incomplete and inaccurate edge information extraction and low measurement efficiency in the process of measuring the three-dimensional shape of the surface of large parts.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Binocular vision three-dimensional morphology measurement method based on time and space constraints
  • Binocular vision three-dimensional morphology measurement method based on time and space constraints
  • Binocular vision three-dimensional morphology measurement method based on time and space constraints

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] Embodiment 1, the present invention adopts two left and right cameras respectively equipped with wide-angle lenses to capture a light strip image. The camera model is viewworks VC-12MC-M / C 65 camera, resolution: 4096×3072, image sensor: CMOS, frame rate: full frame, maximum 64.3fps, weight: 420g. The wide-angle lens model is EF 16-35mm f / 2.8L II USM, the parameters are as follows, lens focal length: f=16-35, APS focal length: 25.5-52.5, aperture: F2.8, lens size: 82×106. The shooting conditions are as follows: the picture pixel is 4096×3072, the focal length of the lens is 17mm, the object distance is 750mm, and the field of view is about 800mm×800mm.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a binocular vision three-dimensional morphology measurement method based on time and space constraints, which belongs to the technical field of computer vision measurement. The binocular vision three-dimensional morphology measurement method based on time and space constraints is for the surface morphology of a large composite structure component, and uses a laser scanning binocular vision measurement system to carry out image acquisition and image processing. Edge information is extracted. The constraints are established. Time dimension information is combined to predict the position of a light strip. An appropriate interested extraction area is established. Laser light strip centers corresponding to left and right light stripe images are fast and accurately extracted. The light stripe center information in a boundary constraint is retained. The light stripe center information beyond the constraint is removed. The retained light strip center information and boundary information are matched and reconstructed. Ultimately, complete three-dimensional morphology information is restored. The method provided by the invention has the advantages of improved measurement efficiency, high measurement accuracy, complete detection information and fast operation speed, and can realize the three-dimensional morphology measurement of the surface of a large part.

Description

technical field [0001] The invention belongs to the technical field of computer vision measurement, and relates to a binocular vision three-dimensional shape measurement method based on time and space constraints. Background technique [0002] With the rapid development of automobile industry, aerospace field, mold and major equipment parts manufacturing technology, people put forward higher requirements for manufacturing precision and quality. For example, the high-precision measurement of the three-dimensional shape of large parts such as the plane and vertical tail of the aircraft is the premise and guarantee of its high-quality connection assembly. The three-dimensional accurate measurement of the surface of such large-scale and irregular objects is a modern measurement technology. problem. The binocular vision measurement method based on laser structured light scanning is a three-dimensional shape measurement method that has been studied in recent years. This method ha...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/25
Inventor 刘巍高鹏张洋李晓东杨帆贾振元高航
Owner DALIAN UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com