Calibration device for total timing accuracy of integrated circuit test system

Abstract

The invention provides a total timing accuracy calibration device for an integrated circuit testing system, which includes a picosecond-level timing precision calibration adapter interface board, a radio frequency connector, and a digital real-time oscilloscope; The test channel connection of the circuit test system, the radio frequency connector is set on the picosecond timing accuracy calibration adapter interface board, and the picosecond timing accuracy calibration adapter interface board is docked with the test channel of the integrated circuit test system, the radio frequency connector The test channel of the digital real-time oscilloscope is connected through the radio frequency cable, and the digital real-time oscilloscope communicates with the integrated circuit test system through the GPIB bus. By designing three kinds of calibration adapter interface boards, including input-to-output timing accuracy, input edge placement accuracy, and output edge placement accuracy, and using radio frequency connectors and radio frequency cables to connect digital real-time oscilloscopes, the total timing of the integrated circuit test system is realized. measurement of precision.

Description

technical field [0001] The invention relates to a calibration system, in particular to a total timing accuracy calibration device for an integrated circuit testing system. Background technique [0002] In high-speed integrated circuit test applications, the requirements for test system time parameters are extremely strict. The overall timing accuracy of the integrated circuit test system is a key time parameter that reflects whether the driving edge or comparison edge of the signal provided by the test system is within the expected time range, and whether the relative time between the signals is accurate. Only by comprehensively and accurately analyzing this core time parameter of the test system can the performance and stability of the test system be guaranteed. [0003] The technical index of the total timing accuracy of the integrated circuit test system is usually at the picosecond level. When the integrated circuit test system drives or measures a certain signal, its d...

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Problems solved by technology

[0003] The technical index of the total timing accuracy of the integrated circuit test system is usually at the picosecond level. When the integrated circuit test system drives or measures a certain signal, its driving edge or comparison edge deviates from the expected time, which will directly lead to the digital timing of the tested integrated circuit. If the test result of the test system is not reliable, the reliability of the integrated circuit under test cannot be guaranteed.

[0004] At present, in China, only the main time base frequency of the test system is measured, or methods such as eye diagram analysis are used to indirectly verify or qualitatively analyze this indicator, and there is no quantitative measurement method and device

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