Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Independent control method of echo gain inside gate for ultrasonic flaw detector

An independent control, gain control technology, applied in the analysis of solids using sonic/ultrasonic/infrasonic waves, detection of response signals, etc.

Active Publication Date: 2015-08-12
NCS TESTING TECH
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide an independent control method for the echo gain in the gate of the ultrasonic flaw detector, which is used to solve the problem that the echo signal gain in the gate needs to be adjusted separately during the flaw detection process

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Independent control method of echo gain inside gate for ultrasonic flaw detector
  • Independent control method of echo gain inside gate for ultrasonic flaw detector
  • Independent control method of echo gain inside gate for ultrasonic flaw detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] In view of the fact that most of the existing ultrasonic flaw detectors can only set a single gain value, which cannot meet the requirement of observing the bottom wave and the defect wave at the same time, the present invention provides a high-performance independent control method for the echo gain in the gate. The figure illustrates the present invention in detail.

[0020] The structure of the method for independent control of echo gain in the gate provided by this embodiment is as follows: figure 1 As shown, it includes a gain control module 101, a dual-channel amplification module 102, a dual-channel A / D acquisition module 103, and a digital signal processing module 104.

[0021] The gain control module 101 is used to control the gain of the amplification modules at all levels.

[0022] The dual channel amplifying module 102 is used to amplify the normal echo signal and the echo signal in the gate respectively.

[0023] The dual-channel A / D acquisition module 103 is used ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An independent control method of echo gain inside gate for ultrasonic flaw detector belongs to the technical field of ultrasonic flaw detection. The method is realized through cooperative working of the following modules: a gain control module, a binary channel amplification module, a binary channel A / D acquisition module and a digital signal processing module. The binary channel amplification module is used to achieve individual control of different echo signal gains; the binary channel A / D acquisition module is used to achieve synchronous of acquisition a echo signals under different gains; the digital signal processing module is used to realize real-time stitching of echo signals under two different gains, so that echo signals under different gains can be observed in the waveform display simultaneously.

Description

Technical field [0001] The invention belongs to the technical field of ultrasonic flaw detection, and in particular provides an independent control method for the echo gain in the gate of an ultrasonic flaw detector, which is suitable for ultrasonic flaw detection of castings or forgings. Background technique [0002] In the process of ultrasonic flaw detection of castings or forgings, it is often necessary to simultaneously monitor the bottom wave and the defect wave. The defect wave signal is weaker, and the bottom wave signal is stronger. Under normal circumstances, in order to ensure that internal defects are not missed or falsely detected, the gain of the instrument needs to be adjusted to a higher level; at this time, the peak of the bottom wave signal often exceeds the display range of the screen, and the waveform appears as a flat top phenomenon. At this time, if there is a large looseness at the bottom of the workpiece, a missed inspection may occur. However, most of t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N29/04G01N29/40
Inventor 谢长武姚君宫小艳申睿李明沈海红
Owner NCS TESTING TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com