A Traceable Method for Calibrating the Elastic Constant of a Microcantilever on an Atomic Force Microscope
A technique of atomic force microscope and micro-cantilever, which is applied in the cross field of nanotechnology and metrology, can solve the problems of explaining differences and incomparability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0017] The traceability method for calibrating the elastic constant of the micro-cantilever beam on the atomic force microscope of the present invention is described in conjunction with the accompanying drawings.
[0018] The traceability method for calibrating the elastic constant of the micro-cantilever beam on the atomic force microscope of the present invention includes an interval division scheme for the range of the elastic constant of the micro-cantilever beam, a design scheme for the physical reference of the micro-cantilever beam, a traceability experimental method, a calculation formula for traceability correction factors, and an atomic force microscope The calculation formula of the thermal noise method for calibrating the elastic constant of any micro-cantilever beam.
[0019] First of all, the interval division scheme of the elastic constant range of the micro-cantilever, according to the elastic constant range of the micro-cantilever that can be calibrated on the ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com