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Single Event Toggle Soft Error Detection Method for FPGA Based on Redundant Interconnection Resources

A single-event flipping and interconnection resource technology, which is applied in the field of FPGA single-event flipping soft error detection based on redundant interconnection resources, can solve problems such as inability to realize double backup and unbalanced resource occupation, and achieve efficient online detection, high-efficiency Effect of Redundant Interconnect Resource Search Algorithm

Active Publication Date: 2017-11-14
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The essence of DWC technology is a detection technology based on hardware redundancy, which needs to provide comprehensive redundancy for various hardware resources such as sequential components, combinational logic, wiring resources, and I / O ports for the circuit, but the comprehensive redundancy strategy will lead to DWC Technology has significant overhead in terms of area, timing, power consumption, and I / O ports
At the same time, the internal resource occupancy rate of FPGA often has a large difference. This kind of unbalanced resource occupancy phenomenon is very common in actual design. Often due to the limitation of certain resources, it cannot realize the complete dual backup comparison technology.

Method used

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  • Single Event Toggle Soft Error Detection Method for FPGA Based on Redundant Interconnection Resources
  • Single Event Toggle Soft Error Detection Method for FPGA Based on Redundant Interconnection Resources
  • Single Event Toggle Soft Error Detection Method for FPGA Based on Redundant Interconnection Resources

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Embodiment Construction

[0037] The embodiments of the present invention will be described below through specific examples and in conjunction with the accompanying drawings, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the spirit of the present invention.

[0038] The FPGA device that the present invention faces is the Virtex series FPGA device of Xilinx Company, and its specific structure diagram is as follows figure 1 shown. The Virtex device adopts an island structure, which is mainly composed of a configurable logic module array CLB, and the CLB is surrounded by an IO module IOB. Each CLB is composed of a logic block (Logic block, LB), an input an...

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Abstract

The invention discloses a method for detecting soft errors of FPGA single event flipping based on redundant interconnection resources, which comprises the following steps: Step 1, establishing the connection relationship in FPGA internal interconnection resources; Step 2, not using logic units, directly Insert a comparison circuit into the FPGA device; Step 3, find a copy line for the existing interconnection resources; Step 4, combine the copy line with the comparison circuit to complete the double-backup comparison of the FPGA based on redundant interconnection resources, and realize error detection. The invention develops an efficient search algorithm for redundant interconnection resources by making full use of the phenomenon that there are many redundancy in the interconnection resources in the design, and realizes the high-efficiency online detection of single-event flipping soft errors by means of a simple modification of the FPGA structure. detection.

Description

technical field [0001] The invention relates to the field of FPGA soft error protection and detection, in particular to a FPGA single-event flip soft error detection method based on redundant interconnection resources. Background technique [0002] At present, most FPGA devices use SRAM, that is, static random access memory (Staic Random Access Memory, SRAM) as a storage unit of configuration information. Although SRAM-type FPGA devices have the advantages of short development cycle, low cost, high performance, low power consumption, and reconfiguration, a large number of SRAM configurable cells existing in SRAM-type FPGA devices are easily affected by high-energy particles and cause single-event overturns ( Single Event Update, SEU) soft error, which makes its structure and function change and produces functional failure. With the continuous improvement of device integration and the continuous expansion of FPGA device application scope, the reliability problem caused by si...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/16
Inventor 熊力孚景乃锋周家成何卫锋毛志刚
Owner SHANGHAI JIAO TONG UNIV
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