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A Method of Detecting Bubble Defects in Glass Based on Mie Scattering

A glass and bubble technology, which is applied in the field of detection of bubble defects inside flat glass, can solve the problems of inability to obtain depth and size information, inability to directly obtain, and low degree of automation.

Active Publication Date: 2017-05-03
ZHEJIANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The existence of bubble defects seriously affects the improvement of glass quality
Traditional glass detection technology generally has the following two types: the first is the detection method of artificial sampling, which uses a strong concentrated light source to transmit the glass sample to make it image on the screen, and compares it with the ordinary flat glass standard sample to measure the defects of the glass. The disadvantage is that it is affected by subjective factors such as the resolution ability of the human eye, and the detection speed is slow and the degree of automation is low; the second is an online defect detection system. The key problem in processing and obtaining the size and two-dimensional position of the defect is the process of image processing. After the information is collected, find a suitable algorithm to process the image. The difference is mainly in the process of image preprocessing, splicing, denoising, segmentation, etc.
The disadvantage is that the depth information of the defect cannot be obtained directly, and the effect of scattering makes the image not completely consistent with the size of the defect itself, so the accurate depth and size information of the defect cannot be obtained

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  • A Method of Detecting Bubble Defects in Glass Based on Mie Scattering
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Embodiment Construction

[0023] The present invention will be described in detail below in conjunction with the embodiments and drawings, but the present invention is not limited thereto.

[0024] Such as figure 1 As shown, the detection device of the present invention includes a laser 1, a first translation stage 3, a CCD detection device 4 and a second translation stage 5, the first translation stage 3 is used to move the measured glass 2, and the second translation stage 5 is used to move CCD detection device 4. The photosensitive chip of the CCD detection device 4 is Sony IC×445, the size of the target surface is 1 / 3 inch, and the pixel size is 3.75um×3.75um. The laser is a 532nm monochromatic laser, the spot mode is TEM00 mode, the beam diameter is 1.5mm, and the beam divergence angle is less than 1mrad.

[0025] The present invention a kind of method based on Mie scattering detection bubble defect inside glass, comprises the following steps:

[0026] (1) After the energy of the 532nm monochro...

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Abstract

The invention discloses a method for detecting bubble defect inside glass based on Mie scattering. The method comprises the following steps: analyzing the scattering process of gaussian beam passing through bubbles inside the glass by utilizing the Mie scattering principle, detecting the scattered gray image of the gaussian beam after passing through the bubbles inside the glass by utilizing a CCD detection device, calculating the distribution curve of scattered light intensity along the angle change through smooth and linear dividing rings, and calculating the particle size of bubbles by utilizing simplex optimization algorithm; and obtaining the light intensity distribution plot at different positions by changing the measurement positions of the CCD detection device, and calculating the depth of bubbles according to the extreme value positions of the light intensity distribution. The invention provides a high-precision non-destructive detection method for bubble defect inside the glass, and the accurate detection on the particle size and depth of micrometer and submicrometer bubbles inside the glass can be realized.

Description

technical field [0001] The invention belongs to the field of non-destructive detection of glass defects, in particular to a method for detecting bubble defects inside flat glass based on Mie scattering. Background technique [0002] Bubbles are gas forms that can be seen in glass. Compared with glass melt, bubbles belong to another state of matter, and are difficult to judge and solve defects in float glass. The existence of bubble defects seriously affects the improvement of glass quality. Traditional glass detection technology generally has the following two types: the first is the detection method of artificial sampling, which uses a strong concentrated light source to transmit the glass sample to make it image on the screen, and compares it with the ordinary flat glass standard sample to measure the defects of the glass. The disadvantage is that it is affected by subjective factors such as the resolution ability of the human eye, and the detection speed is slow and the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/958G01N21/49G01B11/22
Inventor 张赛汪凯巍王晨茹锋
Owner ZHEJIANG UNIV
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