Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Temperature compensation method used for compact tension sample high temperature crack expansion test

A technology for compact tensile specimen and crack propagation test, which is applied in the field of measurement and can solve problems such as inaccurate measurement results

Inactive Publication Date: 2015-04-22
AVIC BEIJING INST OF AERONAUTICAL MATERIALS
View PDF4 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the previous DC potentiometric method did not consider the influence of temperature on the measurement results. The voltage value measured on the sample includes the voltage value generated by the crack length and the voltage value generated by the temperature change, and the measurement result is inaccurate.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Temperature compensation method used for compact tension sample high temperature crack expansion test
  • Temperature compensation method used for compact tension sample high temperature crack expansion test
  • Temperature compensation method used for compact tension sample high temperature crack expansion test

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The technical scheme of the present invention will be described in further detail below in conjunction with accompanying drawing and embodiment:

[0021] See attached Figure 1~3 As shown, the steps of the temperature compensation method for the high-temperature crack growth test of the compact tensile sample described in the technical solution of the present invention are:

[0022] Step 1. With reference to the requirements of the navigation mark HB7680-2000, process two identical compact tensile samples. The material grade of the sample is a nickel-based superalloy of GH4169G. One of the samples is a reference sample (11), and the other Sample is test sample (12), and described sample width W is 40mm, and sample thickness B is 10mm, and the sample on both sides of the notch (1) of test sample (12) and reference sample (11) Mark a current input welding point position (3) on each width surface (2), and the current input welding point position (3) is in the center of th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention relates to a temperature compensation method used for compact tension sample high temperature crack expansion tests, sample width surfaces (2) on both sides of notches (1) of a test sample (12) and a reference sample (11) are respectively marked with current input solder joint positions (3), sample thickness surfaces (4) on both sides of opening ends of the notches (1) of the test sample (12) and the reference sample (11) are respectively marked with voltage output solder joint positions (5), four connection wires (7) at the current input solder joint positions (3) of the test sample (12) and the reference sample (11) are connected in series and connected with a DC power supply (8), every two wires (7) at the voltage output solder joint positions (5) of the test sample (12) and the reference sample (11) are connected with a signal amplifier (9), the signal amplifier (9) is connected with a computer (10), the test sample (12) and the reference sample (11) are put into a furnace and heated to test temperature, voltage time-varying curve are respectively drawn by use of voltage values during the test process of the test sample (12) and the reference sample (11), and finally a corresponding crack length a can be calculated by a voltage value.

Description

technical field [0001] The invention relates to a temperature compensation method for a high-temperature crack growth test of a compact tensile sample, belonging to the technical field of measurement. Background technique [0002] In the study of fatigue crack growth, the measurement of crack length is the key technology to obtain crack growth performance data. Observation of crack length at cryogenic temperatures is currently done directly through a microscope. However, the main and a large number of tests of aero-engine materials are carried out under high temperature conditions. At high temperatures, the surface of the sample is oxidized and blackened, and the crack length cannot be observed by visual inspection. The measurement of the surface oxidation and blackening crack length of the sample is currently in the standard test method (such as the American standard ASTM E647-08, the aviation standard HB 7680-2000), and the automatic test method for the crack growth is pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/02G01B7/02
Inventor 王亮黄新跃郭广平
Owner AVIC BEIJING INST OF AERONAUTICAL MATERIALS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com