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A Micrometer Calibration System

A technology of micrometer and verification device, which is applied in the direction of micrometer, etc., can solve the problem of low efficiency of micrometer verification, achieve the effect of improving flexibility and adaptability, improving accuracy and reducing human error

Active Publication Date: 2017-06-06
王煜
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In order to solve the low efficiency of existing micrometer verification, high work intensity, and improve the accuracy and verification precision of the micrometer verification results, the solution of the present invention is:

Method used

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  • A Micrometer Calibration System
  • A Micrometer Calibration System
  • A Micrometer Calibration System

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Embodiment Construction

[0077] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0078] In the following description, specific details are set forth in order to provide a thorough understanding of the present invention. However, because the present invention can be implemented in many other ways different from those described here, those skilled in the art can make similar promotions without violating the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below .

[0079] Such as figure 1 with figure 2 As shown, the present embodiment provides a micrometer verification system, which includes: a micrometer verification device, including a stepped micrometer verification platform 1, wherein a micrometer fixing fixture 12 that can slide laterally is a...

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Abstract

The invention relates to a micrometer verification system which comprises a micrometer verification device, an automatic microdrum rotating device, a machine vision device, a three-dimensional operating table and a block gauge clamping device. The micrometer verification device comprises a step-shaped micrometer verification table, a micrometer fixing clamp capable of sliding transversely is arranged on a high step, and a micrometer verification position locating mechanism used for supporting and locating a micrometer lead screw detecting head and a fixed detecting head is arranged on a low step of the micrometer verification table. The automatic microdrum rotating device is arranged on the micrometer verification table, and used for automatically rotating a microdrum of a micrometer. The machine vision device is erected on the micrometer verification table. The three-dimensional operating table is arranged on the micrometer verification table. The block gauge clamping device is arranged on the three-dimensional operating table, and used for clamping a block gauge on a block gauge box, and the block gauge box is arranged below the three-dimensional operating table. The problem that existing micrometer verification is low in efficiency and large in work strength is solved, and the accuracy and verification precision of a micrometer verification result are improved.

Description

technical field [0001] The invention relates to the technical field of micrometer verification, in particular to a micrometer verification system. Background technique [0002] At present, in the micrometer verification work carried out by the metrology and inspection department, only a few detection indicators have simple auxiliary devices, and the entire verification process is done manually, which has the following disadvantages: 1. Block gauges and auxiliary devices cannot be placed in a centralized and orderly manner , They must be gathered together during the verification, and they must be put back to the original place after the verification is completed. It is time-consuming and labor-intensive and extremely inconvenient because the block gauge is easy to be damaged by moving back and forth; 2. The inspector must hold the micrometer in hand to align the block gauge for verification 3. The detection point without a standard block gauge must be spliced ​​by two standar...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B3/18
Inventor 涂宝章邱思杰黄友杰龙掁弘
Owner 王煜
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