Method and device for measuring non-uniformity of critical current density of surface layer of high-temperature superconducting bulk material
A technology of critical current density and high-temperature superconductivity, which is applied in the field of magnetic measurement, can solve problems such as the inability to obtain critical current density, and achieve the effect of ensuring stability
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[0030] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.
[0031] The invention provides a method and device for measuring the non-uniformity of critical current density on the surface of a high-temperature superconducting block, such as figure 1 As shown, the measuring device includes an excitation coil 1 , a secondary coil 2 , a coil support 3 , a sample platform 4 to be tested, a lock-in amplifier 11 , a power amplifier 12 , a precision resistor 6 and an impedance adjustment resistor 7 . Both the precision resistor 6 and the impedance adjusting resistor 7 are connected in series on the excitation coil 1, and the measurement method and device mentioned in the present invention can be used to measure the inhomogeneity of critical current density on the surface layer of high temperature superconducting bulk material.
[0032] Wherein, the excitation coil 1 is wound on the coil support 3 , the secondary coil 2...
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