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System and method for automatic temperature test and long time test of network equipment

A network equipment, cyclic testing technology, applied in transmission systems, digital transmission systems, data exchange networks, etc., can solve the problems of cumbersome testing process, low data accuracy and testing efficiency, etc.

Active Publication Date: 2015-03-25
SHENZHEN GONGJIN ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since this test method requires manual recording, the test process is cumbersome, and the data accuracy and test efficiency are low.

Method used

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  • System and method for automatic temperature test and long time test of network equipment
  • System and method for automatic temperature test and long time test of network equipment
  • System and method for automatic temperature test and long time test of network equipment

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Embodiment Construction

[0019] In order to make the objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0020] figure 1 It is a schematic structural diagram of a system for automatically performing high and low temperature and long-term cycle tests of network equipment in an embodiment. The system for automatically performing high and low temperature and long-term cycle tests on network equipment includes a test environment creation device 110 , a test device 120 and a temperature and humidity meter 130 .

[0021] The test environment creation device 110 includes a closed box for creating a test environment. During the test, the network device 10 is placed in the test environment creation device 110 . In this embodiment, the network device 10 is a network product that requires a throughput test, and may be a router, a PLC product (power mode...

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Abstract

The invention provides a system for automatic temperature test and long time test of network equipment. The system comprises a test environment creating device, a hygrothermograph, and a test device, wherein the test environment creating device comprises an airtight box body used for creating the test environment, the hygrothermograph is used for measuring the temperature and humidity of the test environment, and the test device is used for testing throughput of the network equipment and acquiring the throughput value of the throughput test, and is also used for sending a temperature and humidity reading instruction to the hygrothermograph, acquiring the temperature value and the humidity value measured by the hygrothermograph, and saving the temperature value, the humidity value and the throughput value so as to finish one round of test. The invention also provides a method for automatic temperature test and long time test of the network equipment. The system can automatically record and save the throughput value of the network equipment and the temperature value and humidity value of the test environment in the temperature test and long time test, thereby improving the test efficiency, being stable and not easy to have an error, and being suitable for long time test.

Description

technical field [0001] The invention relates to the technical field of automatic testing, in particular to a system for automatically performing high-low temperature and long-time cycle tests on network equipment, and also relates to a method for performing high-low temperature and long-time cycle tests on network equipment. Background technique [0002] With the continuous development of technology, people have higher and higher requirements for various performances of products. For network equipment such as routers, PLC products (power cats), etc., when performing product performance tests, such as high and low temperature tests and long-term cycle tests (LTT, Long Time Test), it is required to conduct a long time in a preset temperature and humidity environment, and It is necessary to manually record the temperature and humidity of the test environment and the throughput of the product at regular intervals. After the test, the recorded data is integrated into a report, a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26
Inventor 纪焕滨刘永升卢伟
Owner SHENZHEN GONGJIN ELECTRONICS CO LTD
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