Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Nano counter electrode and preparation method thereof

A nano-electrode technology, which is applied in the field of nano-counter electrodes and its preparation, can solve the problems that cannot meet the requirements of the structural size design of nano-electronic devices, reduce the precision of layout making, and complicate the manufacturing process, so as to reduce the interference of nearby scattered electrons and effectively It is beneficial to control the distance and the effect of simple process

Active Publication Date: 2017-06-20
INST OF PHYSICS - CHINESE ACAD OF SCI
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existence of the neighbor effect makes the actual width of the exposed pattern after the final development larger than the width of the original layout design, which reduces the precision of layout production and makes the production process more complicated.
[0007] At present, positive electronic resists are used to prepare metal nano-electrodes. Due to the existence of the neighbor effect, the distance between the prepared metal nano-counter electrodes reaches 30-100 nanometers.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Nano counter electrode and preparation method thereof
  • Nano counter electrode and preparation method thereof
  • Nano counter electrode and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0040] In order to solve the problem that the distance between the nano-counter electrodes is relatively large and the nano-counter electrodes are not stable and reliable due to the proximity effect existing in the traditional method of making nano-counter electrodes with zero line width or rectangular wire frame exposure, the present invention provides a A method for preparing a nano-counter electrode comprises the following steps: firstly, designing and determining an exposure layout, and then performing electron beam exposure according to the exposure layout to obtain a nano-counter electrode.

[0041] figure 1 is the structure diagram of the nano-counter electrode. From figure 1 It can be seen from the figure that the nano-counter electrode 50 is also connected with a lead electrode 51 . Lead electrodes 51 are mainly used for transition to other electronic structures, and can be completed together with the overall wire routing process. Therefore, in addition to designin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a nanometer counter electrode and a manufacturing method of the nanometer counter electrode. The manufacturing method includes the steps of arranging a substrate, and arranging a resist on the substrate; determining an exposure layout, wherein the exposure layout is provided with a nanometer counter electrode pattern used for forming the nanometer counter electrode, the nanometer counter electrode pattern is formed by two long-strip-shaped parts extending in the same straight line, the long-strip-shaped parts are arranged in an axial symmetry mode, each long-strip-shaped part comprises a rectangle and a triangle, one short edge of each rectangle is coincident with one edge of the corresponding triangle; the triangle of one long-strip-shaped part faces the triangle of the other long-strip-shaped part; conducting electron beam lithography, developing and photographic fixing on the resist according to the exposure layout to form an etching groove; depositing metal on the substrate with the etching groove, dissolving the residual resist, and obtaining the nanometer counter electrode. The nanometer counter electrode is of a point contact structure, the performance is more stable and reliable, the contact area and the radiation are smaller, the neighbor effect is weakened, the microcell exposure dose is better regulated and controlled, the exposure resolution ratio is improved, and the nanometer counter electrode with space ranging from 3 nm to 10 nm is obtained.

Description

technical field [0001] The invention relates to the technical fields of micro-nano device processing and quantum information, in particular to a nano-counter electrode and a preparation method thereof. Background technique [0002] Electrons have particle and wave properties at the same time. The De Broglie wavelength of free electrons in materials is on the order of nanometers. When the size of the element reaches the order of electron wavelength, there will be obvious quantum effects. For example, in semiconductor integrated circuits, when the circuit size is close to the wavelength of electrons, electrons will overflow the device through the tunnel effect, making the device unable to work normally. Also in nanoscale components, the electron transfer process will interfere like light waves, not only has very little energy dissipation, but also can store and transfer electronic phase information, making it an ideal information processing component. Therefore, nanoelectroni...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/02G03F7/00B82Y10/00B82Y40/00
CPCB82Y10/00B82Y40/00G03F7/20H01L21/0274
Inventor 唐成春顾长志李俊杰杨海方全保刚姜倩晴
Owner INST OF PHYSICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products