High-resolution time interval measuring device with temperature compensation function

Abstract

The invention provides a high-resolution time interval measuring device with a temperature compensation function and aims to solve the problem that time interval measuring accuracy is affected by small errors caused by a constant-current source circuit. A first resistor and a second resistor are added at an output end of an operational amplifier in the constant-current source circuit, and resistance value of the second resistor is 1 / N of that of an equivalent resistor of a first NPN triode. Equivalent noise current output by the operational amplifier is at a fixed value, so that noise equivalent current entering a base electrode of the first NPN triode is reduced to be 1 / (N+1) of an original value through current dividing of the resistance value of the second resistor, the high-resolution time interval measuring device has the characteristic of low noise, and measuring accuracy is improved.

Description

technical field [0001] The invention belongs to the technical field of time interval measurement, and more specifically relates to a high-resolution time interval measurement device with a temperature compensation function. Background technique [0002] High-resolution time interval measurement technology is widely used in various scientific research and production fields such as electronic instruments, laser ranging, and physical experiments, and is the basic technology in these fields. Currently widely used time interval measurement methods mainly include direct counting method, analog interpolation method, digital vernier method, delay line method and time-amplitude conversion method. [0003] The direct counting method converts the measured signal into a gate signal, controls the high-speed circuit to count the high-speed clock, and obtains the time interval of the measured signal. The principle of this method is relatively simple, but to achieve picosecond-level accura...

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Problems solved by technology

[0011] The specific circuit of the TAC converter is described in many documents, but it is more of a theoretical description. Since the previous time interval measurement accuracy did not reach the order of several picoseconds, the tiny constant current source circuit caused by it The error has not been studied in depth, and there is no special explanation for the indicators of the constant current source circuit.

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