Damage identification method based on improved similar Bayesian calculation
A damage identification and Bayesian technology, applied in computing, special data processing applications, instruments, etc., can solve problems such as increased calculation, unsolvable regularization constants, and practical discount of Bayesian methods to improve solution efficiency , improve computing efficiency, and enhance practicality
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[0027] The technical solution of the present invention will be specifically described below in conjunction with the accompanying drawings.
[0028] The present invention combines approximate Bayesian calculations [18] , Monte Carlo Markov Chain Sampling [17] and the random response surface [19] 3 methods, an improved Bayesian damage identification method is proposed. First, the approximate Bayesian calculation is used to make the solution process of the parameter posterior probability distribution unnecessary to calculate the likelihood function of the parameter, which solves the problem that the likelihood function cannot be solved in practical engineering applications. The Monte Carlo Markov chain sampling first establishes a probability model similar to the problem to be solved, then performs random simulation or statistical sampling on the model, and then uses the sample to obtain the estimated value of its statistical characteristics, and uses it as the original problem...
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