High-temperature test system and test method for complex dielectric constant in an oxygen-poor environment
A complex permittivity and testing system technology, which is applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as few researches and complex constitutive equations
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0046] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0047] This embodiment provides a high-temperature test system for complex permittivity in an oxygen-poor environment, which is used to test complex permittivity using a cylindrical cavity perturbation method, including:
[0048] The test part includes a cylindrical resonant cavity 1, an air storage cylinder 10 above the cylindrical resonant cavity 1, a pressure detection gauge 15 connected to the air storage cylinder, and a vacuum pum...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com