Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Comparator Circuits for Analog-to-Digital Converters

A technology of analog-to-digital converter and comparison circuit, applied in analog/digital conversion, code conversion, instruments, etc., can solve problems such as difficulty in increasing integral voltage, large integral voltage, limited integral voltage of analog circuit, etc., to reduce input offset The effect of voltage, high precision, and low power consumption

Active Publication Date: 2018-06-26
CHINA RESOURCES MICROELECTRONICS (CHONGQING) CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the integration time is prolonged, the integration voltage will become larger, but the actual analog circuit can withstand a limited integration voltage, and it is difficult to increase the integration voltage due to the limitation of the characteristics of the integration capacitance.
Therefore, it is difficult to further improve the conversion accuracy of this integral A / D converter.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Comparator Circuits for Analog-to-Digital Converters
  • Comparator Circuits for Analog-to-Digital Converters
  • Comparator Circuits for Analog-to-Digital Converters

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0072] The following describes the implementation of the present invention through specific specific examples. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention.

[0073] See Figure 1 ~ Figure 5 . It should be noted that the illustrations provided in this embodiment only illustrate the basic idea of ​​the present invention in a schematic way, and the figures only show the components related to the present invention instead of the number, shape, and shape of the components in actual implementation. For size drawing, the type, quantity, and proportion of each component can be changed at will during actu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a comparison circuit for an analog-digital converter. The comparison circuit comprises a first operational amplifier, a first detuning calibration capacitor, a second detuning calibration capacitor, a second operational amplifier, a comparator and a regeneration latch. According to the comparison circuit, higher precision and low power consumption can be acquired on the premise that the performance requirement for an original comparator is met, the input detuning voltage of the comparator is effectively reduced, and the comparison circuit can be applied to circuits of SAR type ADC converters and other analog-digital converters.

Description

Technical field [0001] The invention belongs to the field of integrated circuit design, and in particular relates to a comparison circuit for analog-to-digital converters. Background technique [0002] Analog-to-digital converter (abbreviated as A / D converter or ADC) refers to an electronic device that converts an analog quantity into a digital quantity. The usual A / D converter collects analog voltage signals from the signal system, and after signal processing, converts the analog voltage signals into equivalent digital voltage signals. The most important performance indicators of A / D converters are conversion accuracy (abbreviated as accuracy) and conversion speed (abbreviated as speed). Accuracy represents the relative error between the actual value of the analog voltage and its corresponding digital value, which can be expressed as "trueness". In A / D converters, resolution and conversion error are usually used to describe conversion accuracy. Resolution refers to the number...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/56
Inventor 朱磊陈立颖薛璐孙东昱
Owner CHINA RESOURCES MICROELECTRONICS (CHONGQING) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products