Method and system for concurrent testing of embedded module

Abstract

The invention relates to the field of software test, in particular to a method and a system for concurrent testing of an embedded module. The method comprises the following steps: S101, setting module information for more than two modules to be tested, and constituting the set modules to be tested into a list to be tested; S102, extracting each module to be tested from the list to be tested, placing each module to be tested into a single thread, and initializing each module to be tested and the thread according to preset initialized content; S103, after initialization in S102 is finished, concurrently starting the thread to execute a module testing function and returning a module testing result; S104, making a statistics on the module testing result and judging whether the module testing result has an error; and S105, the module testing result has the error, storing the module testing result to a preset error log file. Due to the adoption of the method, whether the module can normally run can be tested when the system is under a high load, and thus the purpose of the testing the module is achieved.

Description

technical field [0001] The invention relates to the field of software testing, in particular to a method and system for concurrent testing of embedded modules. Background technique [0002] Due to the large number of embedded product modules and the high degree of integration with the system, the modules may have conflicts in the use of system resources (such as serial ports, USB, etc.). resources and cause it to fail to function properly. [0003] When multiple modules run at the same time, the load on the system is relatively large, so other modules or the system may run abnormally during concurrent execution. In the traditional embedded module concurrency test, by writing a concurrency test script for each module and embedding the script into the concurrent process, once a new module or a change in the module needs to modify the concurrency strategy, the concurrent process needs to be modified, and at the same time The requirements for flexible configuration cannot be r...

AI Technical Summary

Problems solved by technology

[0002] Due to the large number of embedded product modules and the high degree of integration with the system, the modules may have conflicts in the use of system resources (such as serial ports, USB, etc.). resources and cause it to fail to function properly

[0003] When multiple modules run at the same time, the load on the system is heavy, so other modules or the system may run abnormally during concurrent execution

In the traditional embedded module concurrency test, by writing a concurrency test script for each module and embedding the script into the concurrent process, once a new module or a change in the module needs to modify the concurrency strategy, the concurrent process needs to be modified, and at the same time It is also impossible to achieve flexible configuration requirements for concurrent modules

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