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Optical power parameter measurement method and device based on crystal resonator

A technology of crystal resonator and parameter measurement, which is applied in the direction of using electric radiation detectors for photometry, etc., can solve the problems of weak displacement signal, large measurement uncertainty, limited application, etc. Applicable effect

Inactive Publication Date: 2016-08-17
NORTHWEST INST OF NUCLEAR TECH +1
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  • Application Information

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Problems solved by technology

The problem with this method is that for high-energy and high-power lasers, a large multiple of light intensity attenuation is required, so the attenuation coefficient of the attenuator needs to be accurately calibrated, resulting in a large measurement uncertainty
This method has a weak displacement signal caused by light pressure in the application, so it puts forward higher requirements on the accuracy and resolution of the displacement sensor, which limits the application of this method

Method used

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  • Optical power parameter measurement method and device based on crystal resonator
  • Optical power parameter measurement method and device based on crystal resonator
  • Optical power parameter measurement method and device based on crystal resonator

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Embodiment Construction

[0034] Taking a common quartz crystal resonator as an example, the measurement principle of the present invention will be introduced below.

[0035] Quartz crystal resonators are referred to as crystal oscillators. They are composed of quartz wafers and electrodes plated on the front and back of the wafers. The electrodes are made of gold, silver, copper and other materials. Usually, their diameter-thickness ratio is greater than 40, which can greatly suppress the non-ground state mode. The coupling improves the working stability of the system. For example, the diameter of a common crystal oscillator is 25.4mm, and the thickness is only 0.3mm.

[0036] When a compressive force or tensile force is applied to the wafer, due to the piezoelectric effect, the crystal will deform and polarize to generate equal amounts of positive and negative charges on the electrodes; if the crystal is connected to a stable self-excited oscillation circuit, it will form a Frequency selection compon...

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Abstract

The invention discloses a method and device for measuring optical power parameters based on a crystal resonator, including a crystal resonator, an oscillating circuit and a frequency measurement unit, the input end of the oscillating circuit is connected to the electrode of the crystal resonator, and the The output end is electrically connected to the frequency measurement unit, and the light beam to be measured is incident on the working surface of the crystal resonator; the measurement method and device of the present invention reflect the incident laser light highly in application, which reduces the requirement for the measurement system to withstand laser radiation, It can be used to measure high-energy laser parameters under the condition of long-time light output. In the implementation, the power of the laser is converted into frequency measurement. Using the characteristics of high measurement accuracy and resolution of modern frequency measurement technology, it can meet the requirements of laser parameters under different power conditions. Measurement, strong applicability, large dynamic range, compact structure, simple engineering and so on.

Description

technical field [0001] The invention relates to a method and device for measuring optical power parameters, in particular to a method and device for measuring high-energy laser power parameters based on a crystal resonator. Background technique [0002] High-energy lasers refer to lasers with an average power greater than 10,000 watts, a duration of more than several seconds, and an output energy of more than tens of thousands of joules. They have important industrial and military application prospects. At present, the measurement method of high-energy laser power is mainly the photoelectric detection method. The laser is incident on the attenuation unit such as the integrating sphere and the optical attenuation film, and then the laser is incident on the surface of the photodetector after the light intensity is attenuated by a large multiple. By measuring the output signal and the attenuation coefficient value, we can get The power value of the laser. The problem with this...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J1/42
Inventor 陈绍武丁彬刘福华斯阳杨鹏翎黄伟吴勇王平冯刚陶蒙蒙
Owner NORTHWEST INST OF NUCLEAR TECH
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