Testing device for long term voltage induction and partial discharge measurement test
A technology of induced voltage and test device, applied in the direction of testing dielectric strength, etc., can solve the problems of increasing compensation amount, overvoltage, bulky and so on
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0019] The present invention provides a test device for long-term induced voltage and partial discharge measurement tests. In order to make the purpose, technical solution and advantages of the present invention clearer and clearer, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0020] see figure 1 , figure 1 The schematic diagram of the testing device for the long-time induced voltage and partial discharge measurement test provided by the present invention, as figure 1 As shown, the test device for long-term induced voltage and partial discharge measurement test includes: control box 100, no partial discharge variable frequency power supply 200 (indicated by variable frequency power supply in the figure), no partial discharge excitation transformer ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com