Test unit for array substrates, array substrate and display device
A technology for testing units and array substrates, which is applied to electrical components, optics, instruments, etc., can solve problems such as misjudgment of test results, increase in the cost of array substrate preparation, and fractures at climbing points, so as to improve accuracy and reduce poor contact Possibility of occurrence of phenomenon, effect of increasing area size
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[0023] The implementation of the present invention will be described in detail below in conjunction with the accompanying drawings and examples, so as to fully understand and implement the process of how to apply technical means to solve technical problems and achieve technical effects in the present invention. It should be noted that, as long as there is no conflict, each embodiment and each feature in each embodiment of the present invention can be combined with each other, and the formed technical solutions are all within the protection scope of the present invention.
[0024] The first aspect of this embodiment provides a test unit for an array substrate, such as figure 1 As shown, the test unit includes a test structure 1 and two metal substrates 2, wherein the test structure 1 includes a connection portion 11 and two contact portions 12, wherein the contact portion 12 is located between the corresponding metal substrates 2 and in contact with the metal substrate 2 , the ...
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