Optical stripe phase spatial domain demodulation method

A demodulation method and phase technology, applied in the field of optical measurement, can solve problems such as long solution time, complexity, and affecting the locality of the fringe phase demodulation algorithm

Active Publication Date: 2014-11-05
广州仪德精密科学仪器股份有限公司
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Problems solved by technology

However, the process of solving the instantaneous frequency distribution of the fringe pattern is relatively complicated. Generally, the wavelet transform is used to solve the instantaneous frequency distribution. The solution takes a long time, which is not suitable for fast and real-time measurement, and the accuracy of the instantaneous frequency will affect the phase demodulation accuracy of the fringe. and the locality of the phase demodulation algorithm

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  • Optical stripe phase spatial domain demodulation method
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  • Optical stripe phase spatial domain demodulation method

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[0057] The method of the invention is used to perform phase demodulation on the optical fringes obtained in the structured light projection profilometry, thereby realizing surface profile measurement. Figure 5 is the optical fringe pattern obtained by structured light projection on a plaster face, and the carrier frequency f of each row of fringes 0 120 (pixels) -1 . Image 6 is the reference optical fringe pattern obtained by structured light projection on a plane, and the frequency f of each row of fringes 0 1 / 20(pixel) -1 . Figure 7 In order to utilize the phase demodulation method of the present invention, with 3 pixels as a sub-region, for Figure 5 Phase distribution calculated from optical fringe pattern. Figure 8 In order to utilize the phase demodulation method of the present invention, with 3 pixels as a sub-region, the number of pixels overlapping two adjacent sub-regions is 0, that is, Δ=3, k=0, for Image 6 Phase distribution calculated from optical fring...

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Abstract

The invention discloses an optical stripe phase spatial domain demodulation method. The demodulation method comprises the following steps: (1) demodulation is carried out on phases of single-row image signals, and phase values of all pixel points of the row are obtained; (2) phases of signals of images of all rows in a two-dimensional optical stripe are demodulated according to the method in the first step, and the phase values of all pixel points of the entire optical stripe graph are obtained. The method is characterized in that the specific demodulation method in the first step is that a formula as described in the specification is adopted for carrying out demodulation on the phase phi(Xm) of the Xm point; and in the formula, Im1, Im2, Im3, and Im4 are total values of light intensity of four adjacent sub regions. Compared with the prior phase demodulation technology, the method of the invention only operates in the spatial domain, locality of the spatial domain is smaller than two stripe periods, and the highest can reach four pixels. The locality is poorer than the time domain phase shift technology but higher than the windowed Fourier transform technology and the wavelet transformation technology. only one stripe graph is needed for the phase, and the method is suitable for dynamic measurement.

Description

technical field [0001] The invention relates to the technical field of optical measurement, in particular to an optical fringe phase demodulation method in optical fringe-based measurement. Background technique [0002] Optical precision measurement based on optical fringes (such as interference fringes, projected fringes, Moiré fringes) is a widely used technique. Automatic analysis of optical fringes is key to the technology. Optical fringe phase demodulation technology is a widely used automatic optical fringe analysis technology. Optical fringes are expressed in the form of phase modulation signals: i(x)=a(x)+b(x)cos[2πf 0 x+φ(x)], where i(x) is the light intensity distribution of a column of signals in an optical fringe pattern (the stripe direction is the row direction), x is the column coordinate of the optical fringe pattern, and a(x) is the background light intensity, b(x) is the modulation amplitude, f 0 is the carrier frequency, φ(x) is the modulation phase. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24G06F19/00
Inventor 钟金钢张子邦马骁
Owner 广州仪德精密科学仪器股份有限公司
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