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Optical aliasing resisting multifrequency laser ranging device and method

A technology of laser ranging and anti-aliasing, which is applied in measuring devices, radio wave measuring systems, and utilizing re-radiation, etc. It can solve problems such as non-synchronous generation of ultra-long wavelengths, non-linear periods that cannot be directly traced to laser rulers, and aliasing. problems, to achieve the effect of improving measurement efficiency and accuracy, overcoming the non-direct traceability of measuring rulers, and increasing flexibility

Active Publication Date: 2014-09-17
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0011] The purpose of the present invention is to solve the problems that the ultra-long wavelength and ultra-short wavelength cannot be synchronously generated in the existing phase laser ranging technology, the laser measuring ruler cannot be directly traced to the source, and the problems of nonlinear periodic error and frequency aliasing are provided. Super-heterodyne and heterodyne-combined anti-optical aliasing laser ranging device and method to achieve the purpose of increasing the flexibility of ranging, simplifying the steps of ranging, and improving measurement efficiency, accuracy and real-time performance

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  • Optical aliasing resisting multifrequency laser ranging device and method
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  • Optical aliasing resisting multifrequency laser ranging device and method

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Embodiment Construction

[0036] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0037] An anti-optical aliasing multi-frequency laser ranging device, characterized in that: the device is composed of a measuring ruler generating unit 1, a laser frequency shifting unit 2, an anti-aliasing measuring optical path 3 and a phase measuring unit 4, wherein the measuring ruler The laser output from the generation unit 1 is output to the input end of the laser frequency shift unit 2, the output reference laser beam 22 and the measurement laser beam 23 of the laser frequency shift unit 2 are output to the anti-aliasing measurement optical path 3, and the output of the anti-aliasing measurement optical path 3 Signal I 3 , I 4 , I 5 , I 6 input to the phase measurement unit 4 respectively;

[0038] The structure of the measuring ruler generating unit 1 is: the laser beam emitted by the frequency reference laser 5 reaches the input end of t...

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Abstract

The invention discloses an optical aliasing resisting multifrequency laser ranging device and method, and belongs to a phase laser ranging technology. The ranging device comprises a measuring scale generating unit, a laser frequency shifting unit, a beam expanding collimating mirror set, a measuring light path and a circuit unit. The ranging method comprises the following steps that firstly, a frequency standard laser and He-Ne lasers are started; secondly, one beam is adopted as a reference laser beam, and the other beam is adopted as measuring lasers; thirdly, c / |v2-v3| is adopted as an accurate measuring scale; fourthly, c / |v1-v2| is adopted as a rough measuring scale; fifthly, a measuring angle cone prism is moved to a target end, the phase difference phi1 of the accurate measuring scale and the phase difference phi2 of the rough measuring scale are obtained respectively, and finally the measured distance value is obtained through the formula. The problem that an overlength wave length and an ultrashort wave length cannot be generated synchronously and the laser measuring scales cannot directly trace to the source, and the problem of the nonlinear circular error and frequency aliasing are solved, and the optical aliasing resisting multifrequency laser ranging device and method have the advantages of being high in measuring efficiency, high in precision and high in stability and real-time performance.

Description

technical field [0001] The invention belongs to phase laser measurement technology, and mainly relates to a phase laser distance measuring device and method. Background technique [0002] Large-scale measurement has attracted much attention in the development of large-scale precision machinery manufacturing, major scientific and technological projects, aerospace industry, shipbuilding industry and microelectronic equipment industry and other large-scale optical-mechanical-electrical integration equipment processing and manufacturing. It is an important basis for the processing and overall assembly of large parts in aerospace vehicles and giant ships. The quality of its measurement methods and equipment performance directly affect the quality of workpieces and assembly accuracy, which in turn affects the operating quality, performance and life of the entire set of equipment. The multi-ruler phase ranging method uses a group of measuring ruler wavelengths from large to small t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S11/12
CPCG01S11/12
Inventor 杨宏兴谭久彬胡鹏程
Owner HARBIN INST OF TECH
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