A constant temperature control system and control method for X-ray fluorescence spectrometer

A fluorescence spectrometer and constant temperature control technology, which is applied in the control/regulation system, temperature control by electric means, temperature control, etc., can solve the problems of crystal plane spacing changes, measurement errors, etc., and achieve the ability to prevent breakdown damage and anti-interference Strong, protective and stable work effect

Active Publication Date: 2016-08-17
BEIJING ARITIME INTELLIGENT CONTROL
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Problems solved by technology

Since the crystal has a certain coefficient of thermal expansion, the change of temperature will cause the change of the interplanar distance of the crystal, which will cause the change of the detection angle and bring errors to the measurement.

Method used

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  • A constant temperature control system and control method for X-ray fluorescence spectrometer
  • A constant temperature control system and control method for X-ray fluorescence spectrometer
  • A constant temperature control system and control method for X-ray fluorescence spectrometer

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Embodiment

[0089] Experimental effect of the present invention is illustrated in conjunction with accompanying drawing;

[0090] Taking the wooden experiment box as an example, the size of the box is: 60cm×40cm×80cm;

[0091] After the control chip is sampled, the corresponding temperature value is obtained by linear fitting calibration. When the system reaches stability, a short-term temperature control accuracy measurement is performed. Taking 1 minute as the benchmark, measuring for 1 hour, a total of 60 measurement data were obtained. The maximum temperature value is 36.05882°C, the minimum temperature value is 35.96973°C, the average value is 36.01049°C, and the mean square error is 6.31×10 -4 ℃. The temperature is well controlled within 0.1°C, meeting the expected control accuracy requirements. The short-term temperature control curve of the constant temperature control system is as follows: Figure 6 shown.

[0092] In order to measure the long-term stability of the system, ...

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Abstract

The invention discloses a constant temperature control system and control method for an X-ray fluorescence spectrometer, which consists of two parts of temperature measurement and temperature control. The temperature measurement part includes: constant current source drive circuit, bridge temperature measurement circuit, and filter limiter circuit; the control algorithm adopts PID linear controller and Fuzzy controller hybrid control; the heater drive circuit adopts photocoupler combined with bidirectional thyristor AC power control. The system of the invention has stable performance and strong anti-interference ability, and can realize a temperature resolution of 0.1°C, and a temperature setting and control accuracy of 36±0.2°C. The system of the invention can not only provide a constant temperature environment for the sample chamber and the spectroscopic chamber of the X-ray fluorescence spectrometer, but also can be applied to the measurement and testing of small environmental occasions requiring constant temperature adjustment.

Description

technical field [0001] The invention relates to a constant temperature control system and control method for an X-ray fluorescence spectrometer, belonging to the technical field of constant temperature control of the spectrometer. Background technique [0002] X-ray fluorescence spectroscopic analysis technology has the advantages of simple sample preparation, high analytical precision, good accuracy, low cost, low pollution, and rapid analysis of multiple elements at the same time. It has a wide range of applications and has become an indispensable three in modern analytical laboratories. One of the big instruments. According to incomplete statistics, there are more than 2,000 high-power wavelength dispersive X-ray fluorescence spectrometers of various types in various analysis fields across the country, and the number is increasing or updating at a rate of 200-300 per year. Since there is no production base of high-power wavelength dispersive X-ray fluorescence spectromet...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223G05D23/24G05D23/30
Inventor 麻硕邱忠义谢鹏宋敏由菁菁
Owner BEIJING ARITIME INTELLIGENT CONTROL
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