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Electronic device performance test method and device

A technology of electronic equipment and testing methods, applied in the direction of detecting faulty computer hardware, etc., can solve the problems of few hardware items, inability to truly reflect the performance of electronic equipment, and inaccurate test results.

Inactive Publication Date: 2014-08-20
BEIJING ANTUTU TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the existing test methods test fewer hardware items, only one or a few common hardware items are tested, and the mutual influence of each item in the actual application scenario is not considered during the test process, resulting in inaccurate The performance of the reaction electronic equipment will eventually lead to inaccurate test results determined

Method used

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Embodiment Construction

[0125] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0126] In order to improve the accuracy of testing the performance of electronic equipment, the embodiments of the present invention provide a method and a device for testing the performance of electronic equipment. Wherein, the electronic device can be a mobile device such as a mobile phone, a desktop computer, a notebook computer, or a tablet computer, and can also be a smart terminal such as a smart TV. Of course, it can also be other electronic devices equipped ...

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Abstract

The embodiment of the invention discloses an electronic device performance test method and device. The method includes the steps of obtaining a test starting instruction, responding to the test starting instruction, and individually testing items to the tested. The items to be tested at least include virtual machine performance and video playing performance. The step of individually testing the items to be tested includes the procedures of testing the virtual machine performance so as to obtain a first execution result, determining a first test result corresponding to the virtual machine performance according to the first execution result, testing the video playing performance after the first execution result is obtained so as to obtain a second execution result, and determining a second test result corresponding to the video playing performance according to the second execution result. Visibly, in the scheme, test accuracy for electronic device performance can be improved through a reasonable item test sequence; in addition, in the scheme, the multiple items of an electronic device can be tested, and therefore performance of the electronic device can be truly and comprehensively reflected.

Description

technical field [0001] The invention relates to the field of electronic equipment testing, in particular to a method and device for testing the performance of electronic equipment. Background technique [0002] With the rapid development of science and technology, various electronic devices are continuously enriched and facilitate the life of the public. Due to the advantages of using electronic equipment to process information conveniently, quickly, and saving resources, the electronic equipment has become an indispensable part of people's life or work. [0003] Among them, the performances of electronic devices of different models are uneven. Therefore, in order for users to fully understand the performances of the electronic devices, it is necessary to test the performances of the electronic devices. In the prior art, the performance test is realized by performing a benchmark test through performance test software. The specific test process is: execute the corresponding ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 蔡旋王颢
Owner BEIJING ANTUTU TECH
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