Test pad sharing circuit
A circuit and test control technology, applied in the direction of electronic circuit testing, etc., can solve the problems of wasting chip area and low efficiency, and achieve the effect of reducing the number and reducing the waste of chip area
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[0016] The implementation of the present invention is described below through specific examples and in conjunction with the accompanying drawings, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0017] figure 2 It is a circuit diagram of a preferred embodiment of a test pad sharing circuit of the present invention. Such as figure 2 As shown, a test pad sharing circuit of the present invention enables a negative voltage circuit, a positive high voltage circuit and a positive low voltage circuit to share one test pad, which includes: a test pad 20 and a control circuit 21 .
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