Reliability testing table for multistage tandem chip removing devices
A technology of chip conveyor and tandem type, which is applied in the field of multi-stage tandem chip conveyor reliability test bench, can solve the problems of long test period, inability to simulate working conditions, and inability to test multiple chip conveyors
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] The present invention is described in detail below in conjunction with accompanying drawing:
[0031] refer to figure 1 , the multi-stage tandem chip conveyor reliability test bench (in this embodiment, a multi-stage tandem chip conveyor reliability test bench formed by connecting three chip conveyors in series) includes a circular chip removal mechanism, a state detection Alarm mechanism and variable speed automatic control mechanism.
[0032] 1. Circular chip removal mechanism
[0033] The circulating chip removal mechanism includes No. 1 chip conveyor 2, No. 2 chip conveyor 10, No. 3 chip conveyor 11, chip collector 7, No. 1 support frame 1, No. 2 support frame 12, and No. 3 support frame 3. Horizontal iron 4, front support block (3 pieces), rear support block (3 pieces), fixed angle steel (6 sets, including bolts, nuts, spring washers); No. 1 support frame 1, No. 2 support frame 12, ground level The front support block and the rear support block are respectively ...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com