Non-contact-type temperature measurement method based on cadmium telluride quantum dot photoluminescence

Abstract

Disclosed is a non-contact-type temperature measurement method based on cadmium telluride quantum dot photoluminescence. The method comprises the steps of assembly of a spectral imaging system, synthesis of semiconductor CdTe quantum dots, sample preparation and temperature calibration. In the spectral imaging system, the peak wavelengths, the luminous intensity and the half-peak breadths of known quantum dot spectrums at different temperatures can be obtained by adjusting the set temperature of a heating platform of a microscope, and three temperature calibration curves of peak wavelength-temperature, and luminous intensity-temperature and half-peak breadth-temperature are obtained. Microelectrode joule heat, micro-fluid heat conduction and the cell body temperature are measured, the problem that a traditional temperature measurement technology is limited by the spatial scale is solved, the operation is easy, convenient and feasible, the temperature measurement position is only required to be accurately positioned, the microelectrode temperature, the micro-channel fluid temperature, the cell body temperature and the like in the scientific research can be accurately and conveniently measured.

Description

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AI Technical Summary

Benefits of technology

This patented method uses special materials called Quantum Dot (QDS) particles or nanoparticles made up from chemical elements like silica for creation of electronic devices such as light emitting diodes (LEDs). These QDL particles have specific properties that help them detect temperatures more precisely than other conventional methods due to their ability to absorb infrared radiation at different wavelength ranges. By measuring these absorption spectra with an optical device attached to this chip, scientists are able to determine how well they work properly based on factors like ambient air conditions and surrounding environment variables.

Problems solved by technology

This patented technical problem addressed in this patents relates to improving the accuracy and reliability of temperature measurements for critical components such as semiconductor chips used in electronic systems or biochip analysis tools that require high temperatures during operation.

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