A comprehensive environmental accelerated storage test device for electronic equipment

Abstract

The invention relates to an electronic device comprehensive environment accelerated storage testing device which comprises a temperature and humidity comprehensive testing box, a control microcomputer and a temperature and humidity tester. An outer box body of a box shell of the temperature and humidity comprehensive testing box is made of corrosion resistant plates, an inner box body of the box shell of the temperature and humidity comprehensive testing box is made of high-and-low temperature resisting corrosion resistant plates, and an insulating layer formed by the inner box body and the outer box body is made of high-density glass fiber cotton or asbestos plates. The control microcomputer and the temperature and humidity tester are both in conventional types. The electronic device comprehensive environment accelerated storage testing device has stable and balanced heating and humidifying capability, can carry out high-accuracy high-stability constant-temperature constant-humidity control and guarantees the safety of equipment and people. As for a temperature and humidity control part of the equipment, the programmable temperature and humidity tester is adopted to be capable of simulating different environmental conditions such as the high-temperature high-humidity environment, the high-temperature low-humidity environment, the low-temperature high-humidity environment, the high-temperature environment and the low-temperature environment. An accelerated storage service life evaluation method based on a reliability growth model avoids selection of an accelerated model, and the electronic device comprehensive environment accelerated storage testing device is mainly used in step-down stress accelerated service life tests and has good adaptability to electronic devices with complicated composition and failure mechanisms.

Description

technical field [0001] The invention provides a comprehensive environment accelerated storage test device for electronic equipment and a life evaluation method thereof, belonging to the technical field of electronic equipment and life evaluation thereof. Background technique [0002] The reliability growth test improves the reliability of the product through planned failures, analysis of failure causes and design improvements, and proving the effectiveness of the improvement measures. Through the reliability growth test, the weak link with low environmental stress resistance is eliminated to improve the environmental stress resistance of the entire product. [0003] For the step stress accelerated life test, although no improvement measures are taken to the product in the test, the stress is increased. Obviously, the reliability of the product will not increase but decrease; therefore, if the increase in the stress level corresponds to the improvement measures taken on the ...

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Problems solved by technology

[0005] For the electronic equipment on the product, its storage time is long and the failure rate is low, the failure mechanism is various, and the research technology is difficult

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