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Test device and test method for performance of photovoltaic module in high-temperature environment

A technology for photoelectric modules and high-temperature environments, which is applied in the direction of measuring devices, lamp testing, and measuring electricity, and can solve problems such as reliability distortion

Active Publication Date: 2013-09-11
STATE GRID SICHUAN ELECTRIC POWER CORP ELECTRIC POWER RES INST +1
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a photoelectric module performance testing device and testing method in a high temperature environment, to solve the current distortion problem of replacing the reliability of the entire photoelectric module with the reliability of the LED, and to achieve the purpose of testing the entire photoelectric module

Method used

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Embodiment

[0059] Such as Figures 1 to 3 As shown, the photoelectric module performance test device under the high temperature environment of the present invention, the photoelectric module performance test device under the high temperature environment, comprises a high temperature oven, an internal test board is installed in the high temperature oven, and an external test board, the internal test board and the external test board Connection, the output signal of the external test board is transmitted to the computer; the internal test board includes an SFP socket, the SDA, SCL, VCC three pins of the SFP socket are connected to the metal terminal, the SDA bus and the SCL bus are connected to the optical module to achieve reading communication, VCC Provide stable power. There are n SFP sockets, n is a natural number greater than 1, and the n SFP sockets are respectively connected to the I2C bus multiplexer and the analog multiplexer. The multiplexer adopts the ADG506AKR model, and the I...

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Abstract

The invention discloses a test device and a test method for the performance of a photovoltaic module in the high-temperature environment. The device comprises a high-temperature oven and further comprises an external test board. An internal test board is mounted in the high-temperature oven and connected with the external test board, and an output end of the external test board is transmitted to a computer. According to the test device and the test method, the heating test is performed on the whole photovoltaic module directly, sample data of 5 key parameters of the photovoltaic module under the temperature change are acquired, and the sample data are calculated through an Arrhenius model, accordingly, the service life of the photovoltaic module under the normal condition is evaluated; and testing can be performed without stripping a light-emitting diode (LED), and scale applications of the test are facilitated; and accelerated factors corresponding to the optimum test temperature can obtain a maximum value. When the test is performed on the temperature, the test time is actually far shorter than time required by the test performed at the specified temperature, the test time is only about 5% of the prior test time, and the test time is greatly shortened.

Description

technical field [0001] The invention relates to an experimental device in the field of accelerated life test, and specifically refers to a photoelectric module performance test device and a test method in a high-temperature environment. Background technique [0002] The unified definition of accelerated life test was first proposed by Merrom Airshow Center in 1967. Accelerated life test is based on reasonable engineering and statistical assumptions, using statistical models related to physical failure laws to accelerate A test method that converts the information obtained in the environment to obtain a reproducible numerical estimate of the characteristics of the product at the rated stress level. In short, the accelerated life test is a life test method that shortens the test period by increasing the test stress while keeping the failure mechanism unchanged. The accelerated life test adopts the accelerated stress level to carry out the life test of the product, thereby sho...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/44
Inventor 舒勤姜振超李旻杨书佺黄宏光顾益双
Owner STATE GRID SICHUAN ELECTRIC POWER CORP ELECTRIC POWER RES INST
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