Three-dimensional scanner measuring method and device
A measurement method and technology of a measurement device, applied in the direction of measurement devices, optical devices, instruments, etc., can solve problems such as large errors, and achieve the effect of avoiding huge costs
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[0033] The technical scheme of the present invention and its principles are further described in detail below in conjunction with the accompanying drawings of the embodiments:
[0034] 1. The principle of sinusoidal virtual light field generation
[0035] Illumination objects are projected for virtual sinusoidal gratings using a Michelson interferometer generation method. Such as figure 1 As shown, the required spatial carrier frequency can be obtained by adjusting the mirror M. R in the figure is the reference plane. The virtual sinusoidal grating is projected onto the reference plane R by the projection system, and then captured by the CCD camera. Finally, the captured data is sent to the computer for processing. The light intensity distribution can be expressed as:
[0036]
[0037] The above formula expresses the grating position offset due to the projection optical axis being perpendicular to the reference plane R.
[0038]2. Measuring principle of small angle grati...
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