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Device and method for measuring phase delay temperature characteristic of optical fiber quarter wave plate

A wave plate phase and temperature characteristics technology, applied in the direction of testing optical performance, etc., can solve the problems that the error model cannot be established, the measurement accuracy of the optical fiber current transformer is affected, and there is no measurement method for the phase delay temperature characteristic of the optical fiber 1/4 wave plate. Achieve the effects of eliminating optical power fluctuations, ensuring detection sensitivity, and accurate online compensation

Active Publication Date: 2013-09-04
开元锐德(北京)光电科技有限公司
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Problems solved by technology

However, at present, since the establishment of the temperature characteristic model of the phase error of the 1 / 4 wave plate is based on theoretical derivation, there is no feasible method for measuring the temperature characteristic of the phase delay of the optical fiber 1 / 4 wave plate, and it is impossible to establish a more accurate error model, which affects the fiber current. Measurement accuracy of transformer

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  • Device and method for measuring phase delay temperature characteristic of optical fiber quarter wave plate
  • Device and method for measuring phase delay temperature characteristic of optical fiber quarter wave plate
  • Device and method for measuring phase delay temperature characteristic of optical fiber quarter wave plate

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Embodiment Construction

[0015] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0016] Such as figure 1 As shown, the optical fiber 1 / 4 wave plate phase delay temperature characteristic measurement device provided by the present invention includes a broadband light source 11 , a polarizer 12 , a 1 / 4 wave plate 13 and a polarization beam splitter (PBS) 14 . figure 1 In the shown embodiment, SLD is selected as the wide-spectrum light source 11 . The light emitted by the SLD11 is polarized by the polarizer 12 and becomes linearly polarized light, and one end of the measured 1 / 4 wave plate 13 is fused with the output pigtail of the polarizer 12 at an angle α, so that the linearly polarized light generated by the polarizer 12 is at 1 The / 4 wave plate 13 is decomposed into two beams of orthogonal linearly polarized light, and the two beams of orthogonally linearly polarized light are respectively transmitted along the fast axis and t...

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Abstract

The invention discloses a device and a method for measuring a phase delay temperature characteristic of an optical fiber quarter wave plate, and belongs to the technical field of optical fiber current transformers. The device comprises a broad spectrum optical source, a polarizer, a quarter wave plate and a polarization beam splitter, wherein one end of the quarter wave plate is in direct-axis welding connection with output tail fibers of the polarizer at an angle alpha in a welding way, and the other end of the quarter wave plate is in direct-axis welding connection with input tail fibers of the polarization beam splitter at an angle beta. According to the method, light emitted from the broad spectrum optical source is polarized into linearly polarized light through the polarizer, the linearly polarized light is split into two beams of orthogonal linearly polarized light through the quarter wave plate, each of the two beams of linearly polarized light is split into two orthogonal linearly polarized light at the input tail fibers of the polarization beam splitter, two beams of linearly polarized light are interfered at a fast axis, two beams of linearly polarized light are interfered at a slow axis, and the phase delay of the quarter wave plate is solved by measuring the interference light intensity of the two output tail fibers of the polarization beam splitter. According to the device and the method, a more accurate phase delay temperature characteristic model for the optical fiber quarter wave plate can be established according to experimental data, and the test accuracy of an optical fiber current transformer can be improved.

Description

technical field [0001] The invention belongs to the technical field of optical fiber current transformers, in particular to a device and method for measuring phase delay temperature characteristics of an optical fiber 1 / 4 wave plate. Background technique [0002] Compared with the traditional electromagnetic induction current transformer, the all-fiber optic current transformer has the advantages of good insulation performance, light weight, no risk of magnetic saturation, large measurement range, and wide response frequency band, etc., so it has been obtained in the past two decades greater development. At present, the main reasons that restrict the practical application of optical fiber current transformers are that the current ratio accuracy in the full temperature range (-40 ~ 60 ℃) is not high enough, the long-term operation stability of the system needs to be improved, and so on. The temperature stability of the phase difference error of the λ / 4 fiber optic wave plate...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 王夏霄王野李传生李立京于佳邬战军杨德伟王熙辰
Owner 开元锐德(北京)光电科技有限公司
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