An optical fiber 1/4 wave plate phase delay temperature characteristic measuring device and method
A wave plate phase and measurement method technology, which is applied in the direction of testing optical performance, etc., can solve the problems of no optical fiber 1/4 wave plate phase delay temperature characteristic measurement method, affecting the measurement accuracy of optical fiber current transformers, and the inability to establish error models, etc. Achieve the effects of eliminating optical power fluctuations, ensuring detection sensitivity, and accurate online compensation
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[0015] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0016] like figure 1 As shown, the optical fiber quarter wave plate phase retardation temperature characteristic measurement device provided by the present invention includes a broad-spectrum light source 11 , a polarizer 12 , a quarter wave plate 13 and a polarization beam splitter (PBS) 14 . figure 1 In the shown embodiment, the broad-spectrum light source 11 selects SLD. The light emitted by SLD11 is polarized into linearly polarized light by polarizer 12, and one end of the tested 1 / 4 wave plate 13 is fused with the output pigtail of polarizer 12 at an angle α on the axis, so the linearly polarized light generated by polarizer 12 is at 1 The / 4 wavelength plate 13 is decomposed into two orthogonal linearly polarized lights, and the two orthogonal linearly polarized lights are transmitted along the fast axis and the slow axis of the 1 / 4 wa...
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