Measuring device of ultrafast optical pulse time wave form

A technology of pulse time and measurement device, applied in the direction of instruments, etc., can solve the problems of affecting the time resolution of measurable signal light, complicated process operation, etc., and achieve the effect of eliminating the space charge effect

Active Publication Date: 2013-07-10
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

However, the measurable time span is difficult to break through 100 ps, ​​and it is necessary to coat the surface of the optical waveguide with wedge-shaped prism array gold film. The process operation is complicated, and the coating technology requires strict requirements. The effect of the coating directly affects the time resolution and dynamic range of the measurable signal light.

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  • Measuring device of ultrafast optical pulse time wave form
  • Measuring device of ultrafast optical pulse time wave form

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Embodiment Construction

[0022] The device of the present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited by this.

[0023] see first figure 1 , it can be seen from the figure that the measurement device of the ultrafast light pulse time waveform of the present invention. In the optical waveguide, two waveguide cores form a Maserhed (MZ) interferometer, and the two arms of the MZ interferometer are figure 1 7 and 9 here. The initial phase difference of the two arms of the MZ is (2k+1)*π (k is an integer), without the vertically incident pump light 3, when the signal light 1 passes through the MZ interferometer, it reaches an extinction state, and there is no signal at the exit end light exits. When the pump light 3 is added, the pump light 5 focused by the cylindrical lens 14 is vertically incident into the optical waveguide, and at the same time, the entire optical pulse...

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Abstract

A measuring device of an ultrafast optical pulse time wave form achieves a breakthrough of an existing and traditional streak camera based on photovoltaic conversion and provides time resolution with picosecond magnitude, a measurable time span with hundreds of picosecond magnitude and a measurable dynamic range of 10<3>-10<5> at the same time. The device mainly comprises an optical waveguide unit, a pump light system and a reading system of a high dynamic range, wherein a functional layer of the optical waveguide unit adopts an Al<0.24>Ga<0.76>As / GaAs / Al<0.24>Ga<0.76>As / GaAs / Al <0.24>Ga<0.76>As structure. Two GaAs sandwich layers form two arms of a MZ interferometer. The measuring device has the biggest advantages of solving the technical problems that the prior art is hard to provide with a big dynamic range, time resolution and a measurable time span at the same time, and stability and reliability of vacuum devices are bad.

Description

technical field [0001] The invention relates to ultrafast pulse measurement, in particular to a measurement device for ultrafast light pulse time waveform. Background technique [0002] A traditional streak camera is mainly composed of a streak phase tube, a high-voltage scanning circuit, a trigger delay circuit, an image acquisition system, and application software. Its working principle is: the signal light is focused on the slit by the lens to form an image, and then photoelectrically converted on the photocathode to form a spatially distributed electron beam, which is then accelerated by the accelerating network, and then focused on the focusing electrode and sent to the electron beam. deflection system. After the accelerated electron beam enters the deflection yoke, the scanning voltage controlled by the external circuit decreases linearly from high to low, and the deflection angle of the electron beam changes continuously under the action of the scanning voltage, and ...

Claims

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Application Information

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IPC IPC(8): G01J11/00
Inventor 吴正香董明明李国扬范薇
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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