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Device for testing light source performance in visible light communication system

A visible light communication and visible light technology, applied in transmission monitoring/testing/fault measurement systems, short-range systems, free space transmission, etc., can solve the problem of not specifically testing the light source performance of LED visible light communication systems, and achieve easy implementation and results. Accurate, easy-to-install effect

Active Publication Date: 2013-03-27
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] However, most of the current research focuses on communication channels, modulation and demodulation methods, transmitting and receiving end circuits, and communication system methods. There is no special device for testing the performance of light sources in LED visible light communication systems. Performance test under luminous flux conditions

Method used

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  • Device for testing light source performance in visible light communication system
  • Device for testing light source performance in visible light communication system
  • Device for testing light source performance in visible light communication system

Examples

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no. 1 example

[0049] For the device for testing the performance of the light source in the visible light communication system in the first embodiment, the testing process is as follows:

[0050] Launching stage: the function generator 10 outputs a square wave signal, which can generally be set from a frequency of 100kHz; this signal is used as the input signal of the amplifier 11, and the output signal can meet the requirements of the variable-angle light emitting bracket 13 after being multiplied by the amplifier. working frequency. The amplified signal is loaded on the variable-angle light-emitting bracket 13 through the biaser 12, and the bias current added by the biaser 12 needs to meet the current required for the variable-angle light-emitting bracket 13 to work; The angle of the light emitting bracket 13 can be changed by the variable angle bracket 130, and the angle of this bracket can be continuously changed between 0°-180° for comprehensive measurement, and several special angle me...

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Abstract

The invention provides a device for testing light source performance in a visible light communication system. The device comprises a transmitting end assembly and a receiving end assembly, wherein the transmitting end assembly is used for exerting an electrical signal to a tested light source to generate a visible light testing signal with a variable transmitting angle, and the receiving end assembly is used for receiving the light testing signal and performing performance testing of the tested light source under different luminous flux conditions. The device can test the performance of the light source under the different luminous flux conditions.

Description

technical field [0001] The invention relates to the technical field of communication system testing, in particular to a device for testing the performance of a light source in a visible light communication system. Background technique [0002] At present, LED visible light communication technology has been verified and has been highly valued by many countries. At present, developed countries and regions such as the United States, Europe, Japan and South Korea have invested manpower and material resources in the research and development of related technologies. Many enterprises or companies have research related to the direction of visible light communication. [0003] The United States is at the forefront of semiconductor lighting research in the world. Boston University has developed a demonstration system for data transmission between two laptops through two flashlights equipped with LED lights; Boeing is also working on multimedia for aircraft Research and development o...

Claims

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Application Information

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IPC IPC(8): H04B10/07H04B10/116
Inventor 裴艳荣杨华赵丽霞王军喜
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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