Device and method for preparing metal needle point

Abstract

The invention provides a device and a method for preparing a metal needle point. The device comprises a control circuit and an electrochemical pool, the control circuit comprises a power supply, a switch and a constant current source, the constant current source is used for maintaining constant current of the device, the electrochemical pool comprises a counter electrode, a metal wire to be prepared and an electrolyte, one end of the counter electrode is connected with a negative electrode end of the control circuit, and one end of the metal wire to be prepared is connected with a positive electrode end of the control circuit. The switch is closed, the constant current source maintains the constant current of the device, and the electrochemical pool starts reaction until the metal wire to be prepared is broken nearby the contact surface between the metal wire to be prepared and the electrolyte level. According to the device and the method for preparing the metal needle point, the constant current source is arranged in the control circuit, the constant current is maintained in the whole process of electrochemical corrosion, thereby the constant rate of electric charge reaching to the surface of the metal wire is maintained, the electrochemical reaction process is stable, the needle point with a small tip curvature radius and smooth surface can be obtained with a high repeatability, and the preparing method is simple in operation and high in success rate.

Description

technical field [0001] The invention relates to the technical field of scanning probe microscopes, in particular to a device and method for preparing ultrafine metal needle tips by constant current electrochemical corrosion. Background technique [0002] Scanning probe microscope (SPM), including scanning tunneling microscope (STM) and atomic force microscope (Atomic force microscope), has become one of the main experimental methods for characterization at the nanoscale since its invention , has made important achievements in many fields involved in nanotechnology. The preparation of the needle tip is one of the key factors for the performance of SPM. In recent years, on the basis of traditional SPM technology, with the emergence of optically coupled SPM technologies such as single organic molecule conductance measurement and tip-enhanced Raman Spectroscopy (TERS), the preparation of traditional tungsten, platinum, silicon and other materials The needle tip has gradually s...

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Problems solved by technology

On the other hand, the contact resistance between the gold wire and the counter electrode and their holding device is difficult to guar

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