Device and method for measuring radar reflection characteristic of plasma coating material

Abstract

The invention discloses a device and a method for measuring the radar reflection characteristic of a plasma coating material. The device comprises a large-area uniform unmagnetized plasma generation unit, a radar cross section measurement mechanism, a microwave unreflected chamber, a supporting guide rail, a supporting sliding block, a measured material plate and a wave-absorbing material, wherein the large-area uniform unmagnetized plasma generation unit and the radar cross section measurement mechanism are fixed in the microwave unreflected chamber; the large-area uniform unmagnetized plasma generation unit is surrounded in a space by the wave-absorbing material; and the wave-absorbing material is provided with a window, so that the measured material plate of the large-area uniform unmagnetized plasma generation unit directly faces the radar cross section measurement mechanism. By the device and the method, plasma can be coated on the surface of a measured material, and the adjustment of the thickness of the plasma and the weakening of the radar echo reflection of a body are further realized, so that the development of the experimental measurement of the radar reflection characteristic of the plasma coating material is met.

Description

technical field [0001] The invention belongs to the technical field of microwave / radar detection, and relates to a device and method for measuring radar reflection characteristics of plasma-coated materials, which can be used to uniformly coat plasma on a material to be tested and measure its radar reflection characteristics. Background technique [0002] As a special dispersion medium, plasma has unique absorption, reflection and scattering properties for electromagnetic waves, which is very different from various conventional materials. Generally, during the high-speed re-entry process of targets such as various spacecraft and warheads, plasma will be produced to cover itself due to friction and high temperature, and its surface is equivalent to a composite material covered with plasma, thereby changing the radar reflection characteristics of the target itself ( Usually to attenuate radar echoes). Therefore, the study of materials and target characteristics under plasma c...

AI Technical Summary

Problems solved by technology

[0015] 1) Plasma cannot cover the surface of the material to be tested

The plasma generated by this type of device is located inside the vacuum chamber, and the front and rear are blocked by quartz observation windows, so the plasma inside cannot be coated on the surface of the material

[0016] 2) Plasma thickness is not adjustable

Under the effect of low pressure diffusion, the plasma in this type of device diffuses and fills the entire cavity evenly. The thickness of the plasma is determined by the inherent size of the cavity and cannot be adjusted arbitrarily.

Images