Nano-thermoelectric multi-parameter in-situ quantitative characterization device based on atomic force microscope

Abstract

The invention relates to a nano-thermoelectric energy material multi-parameter in-situ quantitative characterization device based on an atomic force microscope, which is used for detecting a micro-area heat conduction coefficient, a Seebeck coefficient and other thermoelectric property parameters of a detected nano-thermoelectric material sample. The device comprises a nano-thermoelectric multi-parameter atomic force microscope in-situ excitation platform and a nano-thermoelectric multi-parameter in-situ detection platform, wherein the nano-thermoelectric multi-parameter atomic force microscope in-situ excitation platform is used for providing a basic hardware platform required in nano-thermoelectric multi-parameter excitation and realizing in-situ simultaneous excitation of a micro-area frequency-tripled heat conduction signal and a micro-area stable-state Seebeck direct current voltage signal of a nano-thermoelectric material; and the nano-thermoelectric multi-parameter in-situ detection platform is used for realizing in-situ real-time detection and data processing of micro-area heat conduction and Seebeck voltage of the nano-thermoelectric material and realizing real-time display of the quantitative characterization results of the micro-area heat conduction coefficient and the Seebeck coefficient. According to the device disclosed by the invention, the nano-detection function of the atomic force microscope, the frequency tripling detection principle of macro-heat conductivity and the test principle of the macro-Seebeck coefficient are combined for establishing a nano in-situ evaluation device which is based on the commercial atomic force microscope and combines the properties of nano-scale heat excitation and thermoelectric multi-parameter detection.

Description

technical field [0001] The application relates to a multi-parameter in-situ quantitative characterization device for nanometer thermoelectric materials based on an atomic force microscope, which belongs to the field of signal detection instruments. Background technique [0002] As an important strategic energy material, thermoelectric materials have very broad application prospects in many important fields such as microelectronics, optoelectronics, deep space exploration, national defense and military industry, and energy conservation and environmental protection. At present, the main obstacle restricting the wide application of thermoelectric materials is their low thermoelectric conversion efficiency. Nanotechnology has opened up a new way for the development of high-performance thermoelectric materials. As a result, nano-thermoelectric materials have become the most active and promising research field in the current international thermoelectric field, and the measurement ...

AI Technical Summary

Problems solved by technology

[0003] Thermal conductivity and Seebeck coefficient are two important physical parameters in the physical properties of thermoelectric materials. At present, their characterization still uses traditional techniques and methods. This method has the following limitations: (1) Its thermal excitation or thermal detection only reflects the temperature of the sample. The macroscopic performance is far from the nanoscale level; (2) The test method is static, and only uses a steady-state thermal excitation method to achieve single-point detection, which cannot reflect the dynamic performance of thermoelectric materials and continuously reflect the change state of the detected parameters with the spatial position ; (3) The thermal conductance, Seebeck coefficient and other thermoelectric multi-parameter tests are completed with multiple sets of discrete devices, which cannot achieve real-time and synchronous detection

At present, there are no reports in this area at home and abroad

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