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Off-axis interferometer

一种干涉仪、离轴的技术，应用在离轴干涉仪领域，能够解决丢失相位信息等问题

Active Publication Date: 2012-07-11
UNIV LIBRE DE BRUXELIES
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Problems solved by technology

Therefore, in the case of an incoherent light source, phase information will be lost in some parts of the recording plane

Method used

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Embodiment Construction

[0128] In interferometry, when partially coherent light is used, it is very important to maintain the coherence of the incident light in the recording plane to observe interference fringes. In many cases, interference fringes are obtained by splitting a first (incident) beam into a second and a third beam and recombining them by introducing a small angle between the third and second beams.

[0129] In this case, the small coherence length of the partially coherent light (the light to be analyzed) introduces a strong limitation: the coherence planes of the two beams are not parallel, they can only interfere in a small region where the two planes intersect, when the coherent When the distance between the planes is greater than the coherence length, no interference is observed.

[0130] this is in figure 1 is shown in , where a beam perpendicular to the plane interferes with another non-parallel beam with an off-axis α from the plane. As shown, non-parallel light is only coher...

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Abstract

The present invention is related to an Interferometer for off-axis digital holographic microscopy (15) comprising: -a recording plane (10); -a grating (G) located in a plane optically conjugated with said recording plane (10), said grating (G) defining a first and a second optical path, said optical path corresponding to different diffraction order.

Description

technical field [0001] The present invention relates to an off-axis interferometer and its use in a device, and a method for an off-axis digital holographic microscope. Background technique [0002] In state-of-the-art interferometers, the incident beam is typically split into target and reference beams and then recombined at the recording plane, where the target and reference beams interfere to produce interference fringes. The purpose of such a device is to measure the complex magnitude of light (ie phase and magnitude information). [0003] Typically, the light used in such measurements is highly coherent, such as that produced by lasers. This has several disadvantages, such as the appearance of coherent noise (speckle field) and the high cost associated with highly coherent light sources. [0004] In many cases, a small angle is introduced between the target beam and the reference beam in order to obtain low frequency spatial heterodyne fringes, such as disclosed in US...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03H1/08G02B21/00G03H1/02G03H1/00
CPCG03H2001/005G03H2222/13G03H1/08G02B21/00G03H2222/18G03H1/02G03H2001/0212G03H1/0443G03H2222/23G03H2222/24G03H2001/0456
Inventor 弗兰克·杜波依斯凯瑟琳·尤拉索斯基
Owner UNIV LIBRE DE BRUXELIES
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