Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Simple shear connection structure pin load vector measuring method and measuring instrument thereof

A single-shear connection, measuring instrument technology, applied in force/torque/work measuring instruments, measuring devices, instruments, etc., can solve the problem of inability to measure the axial load of nails, and achieve the effect of wide application range and low cost

Inactive Publication Date: 2012-06-27
BEIHANG UNIV
View PDF4 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Not only that, but this type of nail load measuring instrument cannot measure the pretightening force on the nail and the axial load on the nail under working conditions.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Simple shear connection structure pin load vector measuring method and measuring instrument thereof
  • Simple shear connection structure pin load vector measuring method and measuring instrument thereof
  • Simple shear connection structure pin load vector measuring method and measuring instrument thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The present invention will be further described in detail below in conjunction with the accompanying drawings.

[0032] Such as Figure 1 to Figure 5 As shown, a nail load measuring instrument with a single shear connection structure of the present invention is processed by ordinary bolts, and four strain gauge attachment grooves are processed on the contact surface between the bolt and the bolt hole (such as figure 2 Middle 9, 10, 11, 12), the strain gage slots are evenly distributed on the contact surface, and are located at the two ends of the two diameters perpendicular to each other. A strain gauge group is attached to each strain gauge attachment groove along the bolt axis, and the strain gauge group is composed of two strain gauges at an angle of ±45° to the bolt axis. At the upper end of each strain gauge slot, there is a lead hole for leading out strain gauge wires. Since the two ±45° strain gauges in the strain gauge slot have a common line, each lead hole ne...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a simple shear connection structure pin load vector measuring method and a measuring instrument thereof. The measuring instrument is formed by processing an ordinary bolt. Four strain gauge pasting grooves are processed on the contact surface of the bolt and a bolt hole, positions of the strain gauge pasting grooves are evenly distributed on the contact surface and respectively located at both ends of two perpendicular diameters. A strain gauge group is pasted axially along the bolt in each strain gauge pasting groove, each strain gauge group is formed by two strain gauges, and the two strain gauges and the bolt axially form an angle of +45 degrees and an angle of -45 degrees. The upper end of each strain gauge pasting groove is provided with a wire leading hole used for leading a wire out of each strain gauge. Due to the fact that the two strain gauges of +45 degrees and -45 degrees in each strain gauge group have a common wire, each wire leading hole needs to lead three wires out, and the total number is 12. The led wires of the strain gauges which are led out are connected on a strain measuring instrument. The measuring instrument achieves direct measurement of simple shear connection structure pin load size and orientation and pin axial force, and is directly formed by processing a standard bolt, low in cost and wide in application scope.

Description

technical field [0001] The present invention relates to a single shear connection structure nail load vector measurement method and measuring instrument, more precisely, a single shear connection structure nail load vector measurement method and measuring instrument based on the resistance strain measurement technology, through multiple measurements on the measuring instrument The strain results of the strain gauges installed at each position are processed to obtain the direction and magnitude of the shear force and axial force on the nail, which belongs to the general measurement technology field of force and stress. Background technique [0002] In complex multi-nail connection structures, in order to optimize the design of connection details and ensure the connection strength of the structure, it is necessary to study the distribution of multi-nail loads. The distribution of nail load is affected by various factors such as geometric dimensions and design tolerances. In ad...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01L5/00
Inventor 张建宇黄明星周龙伟赵丽滨
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com