Y-shaped cavity orthogonal polarization laser-based force and mass measurement method and device

Abstract

The invention relates to a Y-shaped cavity orthogonal polarization laser-based force and mass measurement method and device. The device consists of a Y-shaped cavity orthogonal polarization laser, a gas diaphragm capsule, a force-applying unit, an operating point selection and control unit and a signal acquisition and processing unit. A force to be measured or the self-gravity of an object to be measured is transferred to an ultra-thin diaphragm of the gas diaphragm capsule through the force-applying unit, the ultra-thin diaphragm is subjected to elastic deformation, the volume of sensing gas in the gas diaphragm capsule is caused to be changed, the refractive index of sensing gas in a P subsection of the Y-shaped cavity orthogonal polarization laser communicated with the gas diaphragm capsule correspondingly changes, thus, the optical length difference between a resonant cavity of S polarized light and a resonant cavity of P polarized light is caused to be changed, the beat frequency difference between the S polarized light and the P polarized light is finally caused to be changed, and the change value of the beat frequency difference is directly proportional to the size of the inputted force. The Y-shaped cavity orthogonal polarization laser-based force and mass measurement method and device have the characteristics of high resolution, large dynamic range, high linearity, direct digital output and the like, and the device can be used as a micro / nano force and micro / nano mass measurement standard transferring instrument through optimizing structural parameters.

Description

technical field [0001] The invention relates to a high-precision force and mass measurement method and device, in particular to a new transfer method for micro-nano force and micro-nano mass measurement standards, belonging to the technical field of laser measurement. Background technique [0002] In the International System of Units (SI), force is a derived quantity based on Newton's second law (F=ma), and mass is often converted into self-gravity in the gravitational field for measurement. Traditional force and mass measurement methods are usually based on Hooke's law, and they often convert input force into elastic deformation of elastic elements (such as springs, elastic diaphragms, etc.). This method generally has shortcomings such as nonlinearity, low precision, poor repeatability and stability. The development of modern laser technology, optical fiber sensing technology, and micro-manufacturing technology has provided favorable conditions for the research of optical ...

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the shortcomings of existing force and mass measurement methods and devices, such as nonlinearity, low precision, and poor anti-interference ability, the present invention provides a high-precision force and mass measurement method and device; by changing its structural parameters, it can be conveniently Adjust the measurement range and resolution of the device to suit different applications; by optimizing its structural parameters, the device can be used as a measurement standard transfer instrument for micro-nano force value and micro-nano mass

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