Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for measuring attosecond X-ray impulse strength and chirp time distribution and application thereof

A technology of ray pulse and time distribution, applied in the field of ultrafast optics, it can solve the problems of large experimental workload, long time, complicated and tedious calculation, etc.

Inactive Publication Date: 2012-06-20
PEKING UNIV
View PDF4 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This not only requires a large amount of experimental work, a long time, and complicated and lengthy calculations, but also affects the stability and fluctuation of parameters such as pulse time jitter, laser carrier-envelope phase CEP (carrier-envelope phase) and laser pulse intensity during the control measurement. and drift very stringent requirements

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for measuring attosecond X-ray impulse strength and chirp time distribution and application thereof
  • Method for measuring attosecond X-ray impulse strength and chirp time distribution and application thereof
  • Method for measuring attosecond X-ray impulse strength and chirp time distribution and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] The present invention will be further elaborated below through specific embodiments in conjunction with the accompanying drawings.

[0045] figure 1 is a schematic diagram of the experimental setup for generating and measuring attosecond X-ray pulses. A strong and short laser, such as a laser pulse with a time width of 7 fs, is focused by the Ag mirror 1 and interacts with the neon atoms 2 to generate high-order harmonics. A zirconium filter 3 is used to separate and obtain higher-energy attosecond X-ray pulses in the forward direction of the laser beam. At the center of the beam is an attosecond X-ray pulse surrounded by laser pulses. After the light beam passes through the aperture 4, a linearly polarized laser beam of required intensity is obtained, which is cross-correlated with the attosecond X-ray pulse in time and space. The relative delay time (or optical path difference) between the attosecond X-ray pulse and the laser pulse is precisely adjusted by two coax...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for measuring attosecond X-ray impulse strength and chirp time distribution and application thereof. According to parametric calculation formulas, relative laser phase of each measured photoelectron can be determined by the photoelectron spectrums acquired from measurement of two different laser strengths, and shape and specific time structures of impulse, including impulse strength and chirp time distribution, are reconstructed by the spectrum analysis technology of the transformation equations of the photoelectron spectrums. Without a great quantity of time-resolved measurement of the photoelectron spectrum or tedious iterative computation or test data fitting process, the method can assist in reconstructing time-domain characteristics of the attosecond X-ray impulse from the two photoelectron spectrums acquired by measuring. Measurement results of the method, serving as reference data, can be used for researching, analyzing, evaluating and optimizing technical parameters and property indexes of the attosecond X-ray impulse light source, and can be used for researching and analyzing relative information varies along with time during the process of superfast reaction dynamics.

Description

technical field [0001] The invention belongs to ultrafast optics, in particular to a method for simultaneously measuring attosecond X-ray pulse intensity and chirp time distribution and its application. Background technique [0002] Whether generating or applying attoseconds (10 -18 second) X-rays, both require the study and measurement of the temporal properties of light pulses, that is, the distribution of intensity and frequency (chirp) as a function of time. Due to the lack of available nonlinear optical effects and corresponding media for measuring attosecond X-rays, these parameters cannot be directly measured with instruments at present. However, X-rays interact with matter such as gas atoms to generate photoelectrons through the photoelectric effect. If these photoelectrons are acted on by the laser electric field at the same time, their final state momentum will have a certain distribution. This distribution is related to the structure of atoms or molecules, the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
Inventor 葛愉成
Owner PEKING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com